Sample handling, preparation and mounting for XPS and other surface analytical techniques

Fred A. Stevie; Roberto Garcia; Jeffrey Shallenberger; John G. Newman; Carrie L. Donley

doi:10.1116/6.0000421

Sample handling, preparation and mounting for XPS and other surface analytical techniques

Fred A. Stevie, Roberto Garcia, Jeffrey Shallenberger, John G. Newman, Carrie L. Donley

Materials Characterization Lab

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

Sample preparation and mounting are important aspects of x-ray photoelectron spectroscopy (XPS) analysis. New users do not know many techniques that are familiar to analysts with years of experience, and these observations and "tricks of the trade"are typically not published. This article is intended to convey the experience of the authors in this field who have creatively analyzed a wide range of samples. Samples can include solids, powders, fibers, porous solids, and even liquids. This information is also important to anyone submitting samples for analysis, since the preparation of the sample may influence the usefulness of the data collected. These techniques are also applicable to other surface analysis methods.

Original language	English (US)
Article number	063202
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	38
Issue number	6
DOIs	https://doi.org/10.1116/6.0000421
State	Published - Dec 1 2020

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1116/6.0000421

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title = "Sample handling, preparation and mounting for XPS and other surface analytical techniques",

abstract = "Sample preparation and mounting are important aspects of x-ray photoelectron spectroscopy (XPS) analysis. New users do not know many techniques that are familiar to analysts with years of experience, and these observations and {"}tricks of the trade{"}are typically not published. This article is intended to convey the experience of the authors in this field who have creatively analyzed a wide range of samples. Samples can include solids, powders, fibers, porous solids, and even liquids. This information is also important to anyone submitting samples for analysis, since the preparation of the sample may influence the usefulness of the data collected. These techniques are also applicable to other surface analysis methods.",

author = "Stevie, {Fred A.} and Roberto Garcia and Jeffrey Shallenberger and Newman, {John G.} and Donley, {Carrie L.}",

note = "Funding Information: This work was performed, in part, at the Analytical Instrumentation Facility (AIF) and the Chapel Hill Analytical and Nanofabrication Laboratory (CHANL), both of which are supported by the State of North Carolina and the National Science Foundation (Award No. ECCS-1542015). The AIF and CHANL are members of the North Carolina Research Triangle Nanotechnology Network (RTNN), a site in the National Nanotechnology Coordinated Infrastructure (NNCI). Publisher Copyright: {\textcopyright} 2020 Author(s).",

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doi = "10.1116/6.0000421",

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T1 - Sample handling, preparation and mounting for XPS and other surface analytical techniques

AU - Stevie, Fred A.

AU - Garcia, Roberto

AU - Shallenberger, Jeffrey

AU - Newman, John G.

AU - Donley, Carrie L.

N1 - Funding Information: This work was performed, in part, at the Analytical Instrumentation Facility (AIF) and the Chapel Hill Analytical and Nanofabrication Laboratory (CHANL), both of which are supported by the State of North Carolina and the National Science Foundation (Award No. ECCS-1542015). The AIF and CHANL are members of the North Carolina Research Triangle Nanotechnology Network (RTNN), a site in the National Nanotechnology Coordinated Infrastructure (NNCI). Publisher Copyright: © 2020 Author(s).

PY - 2020/12/1

Y1 - 2020/12/1

N2 - Sample preparation and mounting are important aspects of x-ray photoelectron spectroscopy (XPS) analysis. New users do not know many techniques that are familiar to analysts with years of experience, and these observations and "tricks of the trade"are typically not published. This article is intended to convey the experience of the authors in this field who have creatively analyzed a wide range of samples. Samples can include solids, powders, fibers, porous solids, and even liquids. This information is also important to anyone submitting samples for analysis, since the preparation of the sample may influence the usefulness of the data collected. These techniques are also applicable to other surface analysis methods.

AB - Sample preparation and mounting are important aspects of x-ray photoelectron spectroscopy (XPS) analysis. New users do not know many techniques that are familiar to analysts with years of experience, and these observations and "tricks of the trade"are typically not published. This article is intended to convey the experience of the authors in this field who have creatively analyzed a wide range of samples. Samples can include solids, powders, fibers, porous solids, and even liquids. This information is also important to anyone submitting samples for analysis, since the preparation of the sample may influence the usefulness of the data collected. These techniques are also applicable to other surface analysis methods.

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Sample handling, preparation and mounting for XPS and other surface analytical techniques

Abstract

All Science Journal Classification (ASJC) codes

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