Scanning the Issue

W. Liu, M. John, A. Karrenbauer, A. Allerhand, F. Lombardi, M. Shulte, D. J. Miller, Z. Xiang, G. Kesidis, A. Oulasvirta, N. R. Dayama, M. Shiripour

Research output: Contribution to journalReview article

Abstract

Computing systems have been facing severe technology challenges in recent years with regard to power consumption, circuit reliability, and high performance. For many years, the issues of power consumption and performance have been addressed with the use of technology scaling.However, as Dennard's scaling tends toward an end, it has become difficult to further improve the performance under the same power constraints. In addition to power, reliability also becomes a critical issue when the feature size of the complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm. Thus, ensuring the complete accuracy of the signal has become increasingly challenging in recent years.

Original languageEnglish (US)
Article number9024191
Pages (from-to)400-401
Number of pages2
JournalProceedings of the IEEE
Volume108
Issue number3
DOIs
StatePublished - Mar 2020

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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  • Cite this

    Liu, W., John, M., Karrenbauer, A., Allerhand, A., Lombardi, F., Shulte, M., Miller, D. J., Xiang, Z., Kesidis, G., Oulasvirta, A., Dayama, N. R., & Shiripour, M. (2020). Scanning the Issue. Proceedings of the IEEE, 108(3), 400-401. [9024191]. https://doi.org/10.1109/JPROC.2020.2975522