Abstract
Most current micro/nanoelectromechanical systems (MEMS/NEMS) are based on silicon. However, silicon exhibits relatively poor mechanical/tribological properties, compromising applications to some devices. Diamond films with superior mechanical/tribological properties provide an excellent alternative platform material. Ultrananocrystalline diamond (UNCD®) in film form with 2-5 nm grains exhibits excellent mechanical and tribological properties for high-performance MEMS/NEMS devices. Concurrently, piezoelectric Pb(Zr xTi1-x)O3 (PZT) films provide high sensitivity/low electrical noise for sensing/high-force actuation at relatively low voltages. Therefore, integration of PZT and UNCD films provides a high-performance platform for advanced MEMS/NEMS devices. This paper describes the bases of such integration and demonstration of low voltage piezoactuated hybrid PZT/UNCD cantilevers.
Original language | English (US) |
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Title of host publication | Microelectromechanical Systems - Materials and Devices |
Pages | 259-264 |
Number of pages | 6 |
Volume | 1052 |
State | Published - 2008 |
Event | Microelectromechanical Systems - Materials and Devices - Boston, MA, United States Duration: Nov 26 2007 → Nov 28 2007 |
Other
Other | Microelectromechanical Systems - Materials and Devices |
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Country/Territory | United States |
City | Boston, MA |
Period | 11/26/07 → 11/28/07 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials