Sensitive Phonon-Based Probe for Structure Identification of 1T′ MoTe2

Lin Zhou, Shengxi Huang, Yuki Tatsumi, Lijun Wu, Huaihong Guo, Ya Qing Bie, Keiji Ueno, Teng Yang, Yimei Zhu, Jing Kong, Riichiro Saito, Mildred Dresselhaus

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

In this work, by combining transmission electron microscopy and polarized Raman spectroscopy for the 1T′ MoTe2 flakes with different thicknesses, we found that the polarization dependence of Raman intensity is given as a function of excitation laser wavelength, phonon symmetry, and phonon frequency, but has weak dependence on the flake thickness from few-layer to multilayer. In addition, the frequency of Raman peaks and the relative Raman intensity are sensitive to flake thickness, which manifests Raman spectroscopy as an effective probe for thickness of 1T′ MoTe2. Our work demonstrates that polarized Raman spectroscopy is a powerful and nondestructive method to quickly identify the crystal structure and thickness of 1T′ MoTe2 simultaneously, which opens up opportunities for the in situ probe of anisotropic properties and broad applications of this novel material.

Original languageEnglish (US)
Pages (from-to)8396-8399
Number of pages4
JournalJournal of the American Chemical Society
Volume139
Issue number25
DOIs
StatePublished - Jun 28 2017

Fingerprint

Phonons
Raman Spectrum Analysis
Raman spectroscopy
Laser excitation
Transmission Electron Microscopy
Multilayers
Lasers
Crystal structure
Polarization
Transmission electron microscopy
Wavelength

All Science Journal Classification (ASJC) codes

  • Catalysis
  • Chemistry(all)
  • Biochemistry
  • Colloid and Surface Chemistry

Cite this

Zhou, Lin ; Huang, Shengxi ; Tatsumi, Yuki ; Wu, Lijun ; Guo, Huaihong ; Bie, Ya Qing ; Ueno, Keiji ; Yang, Teng ; Zhu, Yimei ; Kong, Jing ; Saito, Riichiro ; Dresselhaus, Mildred. / Sensitive Phonon-Based Probe for Structure Identification of 1T′ MoTe2. In: Journal of the American Chemical Society. 2017 ; Vol. 139, No. 25. pp. 8396-8399.
@article{18ecbc154e4c4c5fb2a96a9a27b4a8a2,
title = "Sensitive Phonon-Based Probe for Structure Identification of 1T′ MoTe2",
abstract = "In this work, by combining transmission electron microscopy and polarized Raman spectroscopy for the 1T′ MoTe2 flakes with different thicknesses, we found that the polarization dependence of Raman intensity is given as a function of excitation laser wavelength, phonon symmetry, and phonon frequency, but has weak dependence on the flake thickness from few-layer to multilayer. In addition, the frequency of Raman peaks and the relative Raman intensity are sensitive to flake thickness, which manifests Raman spectroscopy as an effective probe for thickness of 1T′ MoTe2. Our work demonstrates that polarized Raman spectroscopy is a powerful and nondestructive method to quickly identify the crystal structure and thickness of 1T′ MoTe2 simultaneously, which opens up opportunities for the in situ probe of anisotropic properties and broad applications of this novel material.",
author = "Lin Zhou and Shengxi Huang and Yuki Tatsumi and Lijun Wu and Huaihong Guo and Bie, {Ya Qing} and Keiji Ueno and Teng Yang and Yimei Zhu and Jing Kong and Riichiro Saito and Mildred Dresselhaus",
year = "2017",
month = "6",
day = "28",
doi = "10.1021/jacs.7b03445",
language = "English (US)",
volume = "139",
pages = "8396--8399",
journal = "Journal of the American Chemical Society",
issn = "0002-7863",
publisher = "American Chemical Society",
number = "25",

}

Zhou, L, Huang, S, Tatsumi, Y, Wu, L, Guo, H, Bie, YQ, Ueno, K, Yang, T, Zhu, Y, Kong, J, Saito, R & Dresselhaus, M 2017, 'Sensitive Phonon-Based Probe for Structure Identification of 1T′ MoTe2', Journal of the American Chemical Society, vol. 139, no. 25, pp. 8396-8399. https://doi.org/10.1021/jacs.7b03445

Sensitive Phonon-Based Probe for Structure Identification of 1T′ MoTe2. / Zhou, Lin; Huang, Shengxi; Tatsumi, Yuki; Wu, Lijun; Guo, Huaihong; Bie, Ya Qing; Ueno, Keiji; Yang, Teng; Zhu, Yimei; Kong, Jing; Saito, Riichiro; Dresselhaus, Mildred.

In: Journal of the American Chemical Society, Vol. 139, No. 25, 28.06.2017, p. 8396-8399.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Sensitive Phonon-Based Probe for Structure Identification of 1T′ MoTe2

AU - Zhou, Lin

AU - Huang, Shengxi

AU - Tatsumi, Yuki

AU - Wu, Lijun

AU - Guo, Huaihong

AU - Bie, Ya Qing

AU - Ueno, Keiji

AU - Yang, Teng

AU - Zhu, Yimei

AU - Kong, Jing

AU - Saito, Riichiro

AU - Dresselhaus, Mildred

PY - 2017/6/28

Y1 - 2017/6/28

N2 - In this work, by combining transmission electron microscopy and polarized Raman spectroscopy for the 1T′ MoTe2 flakes with different thicknesses, we found that the polarization dependence of Raman intensity is given as a function of excitation laser wavelength, phonon symmetry, and phonon frequency, but has weak dependence on the flake thickness from few-layer to multilayer. In addition, the frequency of Raman peaks and the relative Raman intensity are sensitive to flake thickness, which manifests Raman spectroscopy as an effective probe for thickness of 1T′ MoTe2. Our work demonstrates that polarized Raman spectroscopy is a powerful and nondestructive method to quickly identify the crystal structure and thickness of 1T′ MoTe2 simultaneously, which opens up opportunities for the in situ probe of anisotropic properties and broad applications of this novel material.

AB - In this work, by combining transmission electron microscopy and polarized Raman spectroscopy for the 1T′ MoTe2 flakes with different thicknesses, we found that the polarization dependence of Raman intensity is given as a function of excitation laser wavelength, phonon symmetry, and phonon frequency, but has weak dependence on the flake thickness from few-layer to multilayer. In addition, the frequency of Raman peaks and the relative Raman intensity are sensitive to flake thickness, which manifests Raman spectroscopy as an effective probe for thickness of 1T′ MoTe2. Our work demonstrates that polarized Raman spectroscopy is a powerful and nondestructive method to quickly identify the crystal structure and thickness of 1T′ MoTe2 simultaneously, which opens up opportunities for the in situ probe of anisotropic properties and broad applications of this novel material.

UR - http://www.scopus.com/inward/record.url?scp=85021627374&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85021627374&partnerID=8YFLogxK

U2 - 10.1021/jacs.7b03445

DO - 10.1021/jacs.7b03445

M3 - Article

C2 - 28541698

AN - SCOPUS:85021627374

VL - 139

SP - 8396

EP - 8399

JO - Journal of the American Chemical Society

JF - Journal of the American Chemical Society

SN - 0002-7863

IS - 25

ER -