Sequential tests for integrated-circuit failures

R. Chandramouli, N. Vijaykrishnan, N. Ranganathan

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We propose a sequential probability ratio test (SPRT) based on a 2-parameter Weibull distribution for integrated-circuit (IC) failure analysis. The shape parameter of the Weibull distribution characterizes the decreasing, constant, or increasing failure rate regions in the bath tub model for IC. The algorithm (SD) detects the operating region of the IC based on the observed failure times. Unlike the fixed-length tests, the SD, due to its sequential nature, uses the minimum average number of device for the test for fixed error tolerances in the detection procedure. We find that SD is, on the average, 96% more statistically efficient than the fixed-length test. SD is highly robust to the variations in the model parameters, unlike other existing sequential tests. Since the accuracy of the tests and the test length are conflicting requirements, we also propose a truncated SD which allows a better control of this tradeoff. It has both the sequential nature of examining measurements and the fixed-length property of guaranteeing that the tolerances be met approximately with a specified number of available measurements.

Original languageEnglish (US)
Pages (from-to)463-471
Number of pages9
JournalIEEE Transactions on Reliability
Volume47
Issue number4
DOIs
StatePublished - 1998

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

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