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Dive into the research topics of 'SiGe epilayer stress relaxation: Quantitative relationships between evolution of surface morphology and misfit dislocation arrays'. Together they form a unique fingerprint.
Chemical Compounds
Epilayers
Dislocations (crystals)
Stress relaxation
Surface morphology
Hatches
Epitaxial growth
Molecular beam epitaxy
Direction compound
Heterojunctions
Deposition rates
Atomic force microscopy
Microstructural evolution
Stress measurement
Thick films
Time measurement
Microscopic examination
Film thickness
Nucleation
Transmission electron microscopy
Wetting
Engineering & Materials Science
Epilayers
Dislocations (crystals)
Stress relaxation
Surface morphology
Hatches
Epitaxial growth
Molecular beam epitaxy
Heterojunctions
Deposition rates
Atomic force microscopy
Microstructural evolution
Stress measurement
Thick films
Time measurement
Microscopic examination
Film thickness
Nucleation
Transmission electron microscopy
Wetting
Physics & Astronomy
stress relaxation
hatches
stress measurement
ridges
wetting
thick films
molecular beam epitaxy
film thickness
atomic force microscopy
curvature
wafers
nucleation
microscopy
transmission electron microscopy