Engineering & Materials Science
Atomic force microscopy
13%
Deposition rates
13%
Dislocations (crystals)
86%
Epilayers
92%
Epitaxial growth
30%
Film thickness
11%
Hatches
30%
Heterojunctions
14%
Microscopic examination
11%
Microstructural evolution
13%
Molecular beam epitaxy
16%
Nucleation
11%
Relaxation
20%
Stress measurement
13%
Stress relaxation
64%
Surface morphology
60%
Temperature
4%
Thick films
13%
Time measurement
11%
Transmission electron microscopy
11%
Wetting
11%
Chemical Compounds
Alloy
6%
Atomic Force Microscopy
7%
Epitaxial Growth
10%
Liquid Film
26%
Misfit Dislocation
100%
Molecular Beam Epitaxy
12%
Nucleation
7%
Strain
6%
Stress Relaxation
72%
Surface
17%
Time
3%
Transmission Electron Microscopy
5%
Physics & Astronomy
atomic force microscopy
6%
curvature
6%
film thickness
7%
hatches
27%
microscopy
6%
molecular beam epitaxy
7%
nucleation
6%
ridges
9%
stress measurement
10%
stress relaxation
58%
temperature
2%
thick films
8%
wafers
6%
wetting
8%