Single-electron force readout of nanoparticle electrometers attached to carbon nanotubes

Jun Zhu, Markus Brink, Paul L. McEuen

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

We introduce a new technique of probing the local potential inside a nanostructure employing Au nanoparticles as electrometers and using single-electron force microscopy to sense the charge states of the Au electrometers, which are sensitive to local potential variations. The Au nanoelectrometers are weakly coupled to a carbon nanotube through high-Impedance molecular junctions. We demonstrate the operation of the Au nanoelectrometer, determine the impedance of the molecular junctions, and measure the local potential profile in a looped nanotube.

Original languageEnglish (US)
Pages (from-to)2399-2404
Number of pages6
JournalNano Letters
Volume8
Issue number8
DOIs
StatePublished - Aug 1 2008

Fingerprint

Electrometers
electrometers
Carbon Nanotubes
readout
Carbon nanotubes
carbon nanotubes
Nanoparticles
nanoparticles
Electrons
impedance
Nanotubes
Nanostructures
Microscopic examination
electrons
nanotubes
microscopy
profiles

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

Cite this

Zhu, Jun ; Brink, Markus ; McEuen, Paul L. / Single-electron force readout of nanoparticle electrometers attached to carbon nanotubes. In: Nano Letters. 2008 ; Vol. 8, No. 8. pp. 2399-2404.
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Single-electron force readout of nanoparticle electrometers attached to carbon nanotubes. / Zhu, Jun; Brink, Markus; McEuen, Paul L.

In: Nano Letters, Vol. 8, No. 8, 01.08.2008, p. 2399-2404.

Research output: Contribution to journalArticle

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