Sinusoidally modulated reactance surface approach for spoof plasmon radiation

Anastasios H. Panaretos, Douglas H. Werner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

In this paper we employ the theory of sinusoidally modulated reactance surfaces (SMRSs) to enable leaky wave antennas (LWAs) capable of converting spoof plasmons (SPs) to radiating modes. SPs are surface waves excited along engineered metallic corrugated surfaces and their dispersion properties closely resemble those of the well-known optical surface plasmon polaritons. By judiciously modifying the depth of the grooves along a corrugated metallic surface the structure is engineered such that it exhibits a sinusoidally modulated reactance profile. In this way, the guided SPs can efficiently couple into free-space radiating modes under the proper conditions.

Original languageEnglish (US)
Title of host publication2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages553-554
Number of pages2
ISBN (Electronic)9781509028863
DOIs
StatePublished - Oct 25 2016
Event2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Fajardo, Puerto Rico
Duration: Jun 26 2016Jul 1 2016

Publication series

Name2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings

Other

Other2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016
CountryPuerto Rico
CityFajardo
Period6/26/167/1/16

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All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Radiation
  • Computer Networks and Communications

Cite this

Panaretos, A. H., & Werner, D. H. (2016). Sinusoidally modulated reactance surface approach for spoof plasmon radiation. In 2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings (pp. 553-554). [7695985] (2016 IEEE Antennas and Propagation Society International Symposium, APSURSI 2016 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APS.2016.7695985