Sliding of zinc oxide nanowires on silicon substrate

A. V. Desai, M. A. Haque

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Adhesion and friction forces between zinc oxide nanowires and silicon substrate were studied in situ inside a scanning electron microscope. A procedure for measuring these forces from the bending profiles of the nanowires was developed and the van der Waals and friction forces were found to be about 81.05 pN and 7.7 nN, respectively. The pronounced friction was explained using nanoscale adhesion-friction coupling mechanisms. Immediate implication of the findings is on the accuracy of nanomechanical characterization using bending experiments.

Original languageEnglish (US)
Article number033102
JournalApplied Physics Letters
Issue number3
Publication statusPublished - Jan 29 2007


All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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