Sodium, rubidium and cesium in the gate oxides of SiC MOSFETs

B. R. Tuttle, S. Dhar, S. H. Ryu, X. Zhu, J. R. Williams, L. C. Feldman, S. T. Pantelides

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

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