Energy-efficiency and reliability are two major design constraints in uencing next generation system designs. In this work, we focus on the interaction between power consumption and reliability considering the on-chip data caches. First, we investigate the impact of two commonly used architectural-level leakage reduction approaches on the data reliability. Our results indicate that the eakage optimization techniques can have very di erent reliability behavior as compared to an original cache with no eakage optimizations. Next, we investigate on providing data reliability in an energy-efficient fashion in the presence of soft-errors. In contrast to current commercial caches that treat and protect all data using the same error detection/correction mechanism, we present an adaptive error coding scheme that treats dirty and clean data cache blocks differently. Furthermore, we present an early-write-back scheme that enhances the ability to use a less powerfu error protection scheme for a onger time without sacrificing reliability. Experimental results show that proposed schemes, when used in conjunction, can reduce dynamic energy of error protection components in L1 data cache by 11% on average without impacting the performance or reliability.
|Original language||English (US)|
|Number of pages||6|
|Journal||Proceedings of the International Symposium on Low Power Electronics and Design|
|State||Published - Jan 1 2004|
|Event||2004 International Symposium on Low Power Electronics and Design, ISLPED 2004 - Newport Beach, United States|
Duration: Aug 9 2004 → Aug 11 2004
All Science Journal Classification (ASJC) codes