Soft error rate measurements in semiconductor memories at Pennsylvania State University

C. Celik, K. Ünlü, S. M. Cetiner, N. Vijaykrishnan, M. J. Irwin, Y. Xie, V. Degalahal

Research output: Contribution to journalConference article

Abstract

In this paper, initial results of the thermal neutron beam effects that focused only on the effect of 10B fission caused by thermal neutron absorption on soft error rate. For next generation technologies, which will have denser configurations and lower operating voltages, one needs to take into account the high-energy neutron impact on device operation for detailed soft error rate analysis. Currently, fast neutron beam studies are in progress at PSBR to observe the effect of fast neutrons on SER. Fast neutron beam achieved by moving sample to the reactor core peripheral by means of a specially designed handling instrument. The fast neutron flux at the reactor core boundary is 5×1012 neutrons/cm2sec, and thermal flux 1.3×1013 neutrons/cm2sec at 1-MW steady state reactor operation. Furthermore, the reactor can be pulsed approximately 10 msec at FWHM, at which the generated fast neutron flux can be as high as 1×1016 neutrons/cm2sec at the core periphery. Thus, one order of magnitude of acceleration factor can be gained that experiment duration will be shortened.

Original languageEnglish (US)
Pages (from-to)292-293
Number of pages2
JournalTransactions of the American Nuclear Society
Volume97
StatePublished - 2007
Event2007 Winter Meeting on International Conference on Making the Renaissance Real - Washington, DC, United States
Duration: Nov 11 2007Nov 15 2007

All Science Journal Classification (ASJC) codes

  • Nuclear Energy and Engineering
  • Safety, Risk, Reliability and Quality

Fingerprint Dive into the research topics of 'Soft error rate measurements in semiconductor memories at Pennsylvania State University'. Together they form a unique fingerprint.

Cite this