Soft errors: Is the concern for soft-errors overblown?

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations
Original languageEnglish (US)
Title of host publicationIEEE International Test Conference, Proceedings, ITC 2005
Pages1270-1271
Number of pages2
DOIs
StatePublished - Dec 1 2005
EventIEEE International Test Conference, ITC 2005 - Austin, TX, United States
Duration: Nov 8 2005Nov 10 2005

Publication series

NameProceedings - International Test Conference
Volume2005
ISSN (Print)1089-3539

Other

OtherIEEE International Test Conference, ITC 2005
Country/TerritoryUnited States
CityAustin, TX
Period11/8/0511/10/05

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

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