Sol-gel fabrication of nanocomposites: Alternate thin layers of PbTiO3 and PbZrO3

Dong Soo Paik, Sridhar Komarneni

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Ferroelectric lead titanate and lead zirconium titanate, antiferroelectric lead zirconate, and alternatively deposited lead titanate-lead zirconate films have been fabricated by the sol-gel method. All the films were crystallized into perovskite structure by annealing at 650°C or 700°C for 30 min. Properties of the films coated onto platinized silicon substrate were examined by XRD and SEM. Variation of dielectric constant and loss, hysteresis behavior, and I-V characteristics were measured for pure and alternatively deposited nanocomposite films in order to investigate the role of the alternatively deposited nanocomposite films on structural and electrical properties. The decrease in leakage current density of PT-PZ nanocomposite film with PT as the first and PZ as the second layer was 10 to 100 times lower than that of PT, PZ, or PZT film.

Original languageEnglish (US)
Pages (from-to)1091-1097
Number of pages7
JournalMaterials Research Bulletin
Volume32
Issue number8
DOIs
StatePublished - Jan 1 1997

Fingerprint

Sol-gels
Nanocomposite films
Nanocomposites
nanocomposites
Lead
gels
Fabrication
fabrication
Silicon
Dielectric losses
Leakage currents
Sol-gel process
Ferroelectric materials
Hysteresis
Structural properties
Electric properties
Permittivity
Current density
Zirconium
Perovskite

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

@article{ccbf859242f24424a9279d79492ea6ed,
title = "Sol-gel fabrication of nanocomposites: Alternate thin layers of PbTiO3 and PbZrO3",
abstract = "Ferroelectric lead titanate and lead zirconium titanate, antiferroelectric lead zirconate, and alternatively deposited lead titanate-lead zirconate films have been fabricated by the sol-gel method. All the films were crystallized into perovskite structure by annealing at 650°C or 700°C for 30 min. Properties of the films coated onto platinized silicon substrate were examined by XRD and SEM. Variation of dielectric constant and loss, hysteresis behavior, and I-V characteristics were measured for pure and alternatively deposited nanocomposite films in order to investigate the role of the alternatively deposited nanocomposite films on structural and electrical properties. The decrease in leakage current density of PT-PZ nanocomposite film with PT as the first and PZ as the second layer was 10 to 100 times lower than that of PT, PZ, or PZT film.",
author = "Paik, {Dong Soo} and Sridhar Komarneni",
year = "1997",
month = "1",
day = "1",
doi = "10.1016/S0025-5408(97)00072-X",
language = "English (US)",
volume = "32",
pages = "1091--1097",
journal = "Materials Research Bulletin",
issn = "0025-5408",
publisher = "Elsevier Limited",
number = "8",

}

Sol-gel fabrication of nanocomposites : Alternate thin layers of PbTiO3 and PbZrO3. / Paik, Dong Soo; Komarneni, Sridhar.

In: Materials Research Bulletin, Vol. 32, No. 8, 01.01.1997, p. 1091-1097.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Sol-gel fabrication of nanocomposites

T2 - Alternate thin layers of PbTiO3 and PbZrO3

AU - Paik, Dong Soo

AU - Komarneni, Sridhar

PY - 1997/1/1

Y1 - 1997/1/1

N2 - Ferroelectric lead titanate and lead zirconium titanate, antiferroelectric lead zirconate, and alternatively deposited lead titanate-lead zirconate films have been fabricated by the sol-gel method. All the films were crystallized into perovskite structure by annealing at 650°C or 700°C for 30 min. Properties of the films coated onto platinized silicon substrate were examined by XRD and SEM. Variation of dielectric constant and loss, hysteresis behavior, and I-V characteristics were measured for pure and alternatively deposited nanocomposite films in order to investigate the role of the alternatively deposited nanocomposite films on structural and electrical properties. The decrease in leakage current density of PT-PZ nanocomposite film with PT as the first and PZ as the second layer was 10 to 100 times lower than that of PT, PZ, or PZT film.

AB - Ferroelectric lead titanate and lead zirconium titanate, antiferroelectric lead zirconate, and alternatively deposited lead titanate-lead zirconate films have been fabricated by the sol-gel method. All the films were crystallized into perovskite structure by annealing at 650°C or 700°C for 30 min. Properties of the films coated onto platinized silicon substrate were examined by XRD and SEM. Variation of dielectric constant and loss, hysteresis behavior, and I-V characteristics were measured for pure and alternatively deposited nanocomposite films in order to investigate the role of the alternatively deposited nanocomposite films on structural and electrical properties. The decrease in leakage current density of PT-PZ nanocomposite film with PT as the first and PZ as the second layer was 10 to 100 times lower than that of PT, PZ, or PZT film.

UR - http://www.scopus.com/inward/record.url?scp=0031210551&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031210551&partnerID=8YFLogxK

U2 - 10.1016/S0025-5408(97)00072-X

DO - 10.1016/S0025-5408(97)00072-X

M3 - Article

AN - SCOPUS:0031210551

VL - 32

SP - 1091

EP - 1097

JO - Materials Research Bulletin

JF - Materials Research Bulletin

SN - 0025-5408

IS - 8

ER -