Specific emitter identification using nonlinear device estimation

Ming Wei Liu, John F. Doherty

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Citations (Scopus)

Abstract

Specific Emitter Identification (SEI) identines radio emitters of interest using only external signal feature measurements. SEI can be used for intelligent gathering, network intrusion detection, battle field management, etc. Although abundant researches have been well developed, most of them are not associated with civil commercial products but radars. In this paper, we propose a method which estimates the power series coefficients of nonlinear devices in the Radio Frequency (RF) front end by observing the spectral regrowth. This external feature is unique due to different system designs and fabrication randomness. The performance of the technique is analyzed and experimented under AWGN channel based on an OFDM system, IEEE 802.11a/g, in both fixed and various transmitted power scenarios.

Original languageEnglish (US)
Title of host publicationProceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF
DOIs
StatePublished - Aug 14 2008
Event2008 IEEE Sarnoff Symposium, SARNOFF - Princeton, NJ, United States
Duration: Apr 28 2008Apr 30 2008

Publication series

NameProceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF

Other

Other2008 IEEE Sarnoff Symposium, SARNOFF
CountryUnited States
CityPrinceton, NJ
Period4/28/084/30/08

Fingerprint

Intelligent networks
Intrusion detection
Orthogonal frequency division multiplexing
Systems analysis
Fabrication

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Liu, M. W., & Doherty, J. F. (2008). Specific emitter identification using nonlinear device estimation. In Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF [4520119] (Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF). https://doi.org/10.1109/SARNOF.2008.4520119
Liu, Ming Wei ; Doherty, John F. / Specific emitter identification using nonlinear device estimation. Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF. 2008. (Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF).
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Liu, MW & Doherty, JF 2008, Specific emitter identification using nonlinear device estimation. in Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF., 4520119, Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF, 2008 IEEE Sarnoff Symposium, SARNOFF, Princeton, NJ, United States, 4/28/08. https://doi.org/10.1109/SARNOF.2008.4520119

Specific emitter identification using nonlinear device estimation. / Liu, Ming Wei; Doherty, John F.

Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF. 2008. 4520119 (Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Liu MW, Doherty JF. Specific emitter identification using nonlinear device estimation. In Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF. 2008. 4520119. (Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF). https://doi.org/10.1109/SARNOF.2008.4520119