Spectral changes in Si–O–Si stretching band of porous glass network upon ingress of water

Huseyin Kaya, Dien Ngo, Stéphane Gin, Seong H. Kim

Research output: Contribution to journalArticle

Abstract

Water ingress into porous glass can induce internal stress, resulting in strains in chemical bonds of the network. For silica and silicate glasses, the position of Si–O–Si stretching mode in infrared spectroscopy is known to vary with the degree of strain in the Si–O network. Then, one could hypothesize that the stress due to water ingress could be probed with infrared spectroscopy. We tested this hypothesis using porous layers formed through aqueous corrosion on a model nuclear waste glass. The porosity and thickness of the porous layer were determined using ellipsometry. The humidity-dependent infrared spectra of the samples showed red-shifts of the Si–O–Si stretching band; however, it was difficult to deconvolute the spectral change due to variation of effective refractive index of the sample upon water ingress. Thus, it was infeasible to unambiguously determine the internal stress of porous glass network upon water ingress using the infrared spectroscopy alone.

Original languageEnglish (US)
Article number119722
JournalJournal of Non-Crystalline Solids
Volume527
DOIs
StatePublished - Jan 1 2020

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Stretching
Infrared spectroscopy
Glass
Water
glass
infrared spectroscopy
water
residual stress
Residual stresses
Radioactive Waste
Silicates
Chemical bonds
radioactive wastes
Ellipsometry
chemical bonds
Radioactive wastes
Silicon Dioxide
red shift
ellipsometry
humidity

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

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abstract = "Water ingress into porous glass can induce internal stress, resulting in strains in chemical bonds of the network. For silica and silicate glasses, the position of Si–O–Si stretching mode in infrared spectroscopy is known to vary with the degree of strain in the Si–O network. Then, one could hypothesize that the stress due to water ingress could be probed with infrared spectroscopy. We tested this hypothesis using porous layers formed through aqueous corrosion on a model nuclear waste glass. The porosity and thickness of the porous layer were determined using ellipsometry. The humidity-dependent infrared spectra of the samples showed red-shifts of the Si–O–Si stretching band; however, it was difficult to deconvolute the spectral change due to variation of effective refractive index of the sample upon water ingress. Thus, it was infeasible to unambiguously determine the internal stress of porous glass network upon water ingress using the infrared spectroscopy alone.",
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Spectral changes in Si–O–Si stretching band of porous glass network upon ingress of water. / Kaya, Huseyin; Ngo, Dien; Gin, Stéphane; Kim, Seong H.

In: Journal of Non-Crystalline Solids, Vol. 527, 119722, 01.01.2020.

Research output: Contribution to journalArticle

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AU - Ngo, Dien

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AU - Kim, Seong H.

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