Spectroellipsometry studies of Zn1-xCdxSe: from optical functions to heterostructure characterization

Joungchel Lee, Byungyou Hong, J. S. Burnham, R. W. Collins, F. Flack, N. Samarth

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

The dielectric functions of 0.5-1.5 μm Zn1×xCdxSe (0≤×≤0.34) epilayers on GaAs have been determined over the photon energy range 1.5≤E≤5.3 eV. These spectra have been parameterized using the Sellmeier approximation for energies less than the fundamental gap at E0 and using a sum of Lorentz oscillators above the gap region. As an example of the usefulness of the approach, expressions are provided that yield the index of refraction of Zn1×xCdxSe (0≤x≤ 0.34) for 1.5 eV≤E<E0. As a second example, we have determined the composition and thickness of a Zn1×xCdxSe quantum well between ZnSe barrier layers.

Original languageEnglish (US)
Pages (from-to)377-382
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume406
StatePublished - Jan 1 1996
EventProceedings of the 1995 MRS Fall Symposium - Boston, MA, USA
Duration: Nov 27 1995Dec 1 1995

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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