Spectroscopic ellipsometry as an in-situ monitoring tool for Bi2Se3 films grown by molecular beam epitaxy

Maria Hilse, Xiaoyu Wang, Phoebe Killea, Frank Peiris, Roman Engel-Herbert

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Spectroscopic ellipsometry as an in-situ monitoring tool for Bi<sub>2</sub>Se<sub>3</sub> films grown by molecular beam epitaxy'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy