Spectroscopic ellipsometry studies of ferroelectric surfaces and thin films

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Spectroscopic ellipsometry was used to investigate the surface properties of a c-axis oriented top seeded grown BaTiO3 crystals and a lead lanthanum zirconate titanate ceramic as a function of the surface preparation conditions. In addition, perovskite thin films grown by several different techniques have been depth profiled in order to relate the microstructure to the observed electrical properties.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
EditorsG.W. Bailey, A.J. Garratt-Reed
Pages570-571
Number of pages2
StatePublished - 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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