Spectroscopic ellipsometry studies on ion beam sputter deposited Pb(Zr, Ti)O₃ films on sapphire and Pt-coated silicon substrates

Susan E. Trolier-McKinstry, H. Hu, S. B. Krupanidhi, P. Chindaudom, K. Vedam, R. E. Newnham

Research output: Contribution to journal › Article › peer-review

43 Scopus citations

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Engineering & Materials Science

Chemical Compounds

Physics & Astronomy