Specular and nonspecular, thickness-dependent, spectral holes in a slanted chiral sculptured thin film with a central twist defect

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Abstract

We demonstrate analytically that two types of spectral holes located approximately in the center of the Bragg regime could be exhibited by a slanted chiral sculptured thin film (STF) containing a 90° twist defect midway through its thickness. One is a nonspecular spectral reflection hole excited by an incident circularly polarized plane wave of the same handedness as the chiral slanted STF, and the other a specular transmission hole excited by an incident circularly polarized plane wave of the opposite handedness. The occurrences of these holes depend on the device thickness, and a crossover thickness can be defined. The existence of both types of spectral holes is sensitive to the dual-periodicity of the slanted chiral STF, and can be completely subverted by the Rayleigh-Wood phenomenon.

Original languageEnglish (US)
Pages (from-to)79-92
Number of pages14
JournalOptics Communications
Volume215
Issue number1-3
DOIs
StatePublished - Jan 1 2002

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Thin films
Defects
defects
thin films
handedness
plane waves
Wood
periodic variations
crossovers
occurrences

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

Cite this

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abstract = "We demonstrate analytically that two types of spectral holes located approximately in the center of the Bragg regime could be exhibited by a slanted chiral sculptured thin film (STF) containing a 90° twist defect midway through its thickness. One is a nonspecular spectral reflection hole excited by an incident circularly polarized plane wave of the same handedness as the chiral slanted STF, and the other a specular transmission hole excited by an incident circularly polarized plane wave of the opposite handedness. The occurrences of these holes depend on the device thickness, and a crossover thickness can be defined. The existence of both types of spectral holes is sensitive to the dual-periodicity of the slanted chiral STF, and can be completely subverted by the Rayleigh-Wood phenomenon.",
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AU - Wang, Fei

AU - Lakhtakia, Akhlesh

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N2 - We demonstrate analytically that two types of spectral holes located approximately in the center of the Bragg regime could be exhibited by a slanted chiral sculptured thin film (STF) containing a 90° twist defect midway through its thickness. One is a nonspecular spectral reflection hole excited by an incident circularly polarized plane wave of the same handedness as the chiral slanted STF, and the other a specular transmission hole excited by an incident circularly polarized plane wave of the opposite handedness. The occurrences of these holes depend on the device thickness, and a crossover thickness can be defined. The existence of both types of spectral holes is sensitive to the dual-periodicity of the slanted chiral STF, and can be completely subverted by the Rayleigh-Wood phenomenon.

AB - We demonstrate analytically that two types of spectral holes located approximately in the center of the Bragg regime could be exhibited by a slanted chiral sculptured thin film (STF) containing a 90° twist defect midway through its thickness. One is a nonspecular spectral reflection hole excited by an incident circularly polarized plane wave of the same handedness as the chiral slanted STF, and the other a specular transmission hole excited by an incident circularly polarized plane wave of the opposite handedness. The occurrences of these holes depend on the device thickness, and a crossover thickness can be defined. The existence of both types of spectral holes is sensitive to the dual-periodicity of the slanted chiral STF, and can be completely subverted by the Rayleigh-Wood phenomenon.

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