Specular and nonspecular, thickness-dependent, spectral holes in a slanted chiral sculptured thin film with a central twist defect

Research output: Contribution to journalArticle

40 Scopus citations

Abstract

We demonstrate analytically that two types of spectral holes located approximately in the center of the Bragg regime could be exhibited by a slanted chiral sculptured thin film (STF) containing a 90° twist defect midway through its thickness. One is a nonspecular spectral reflection hole excited by an incident circularly polarized plane wave of the same handedness as the chiral slanted STF, and the other a specular transmission hole excited by an incident circularly polarized plane wave of the opposite handedness. The occurrences of these holes depend on the device thickness, and a crossover thickness can be defined. The existence of both types of spectral holes is sensitive to the dual-periodicity of the slanted chiral STF, and can be completely subverted by the Rayleigh-Wood phenomenon.

Original languageEnglish (US)
Pages (from-to)79-92
Number of pages14
JournalOptics Communications
Volume215
Issue number1-3
DOIs
StatePublished - Jan 1 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Specular and nonspecular, thickness-dependent, spectral holes in a slanted chiral sculptured thin film with a central twist defect'. Together they form a unique fingerprint.

  • Cite this