Speedster-EXD: A new event-driven hybrid CMOS X-ray detector

Christopher V. Griffith, Abraham David Falcone, Zachary R. Prieskorn, David Nelson Burrows

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Abstract

The Speedster-EXD is a new 64×64 pixel2, 40-μm pixel pitch, 100-μm depletion depth hybrid CMOS X-ray detector with the capability of reading out only those pixels containing event charge, thus enabling fast effective frame rates. A global charge threshold can be specified, and pixels containing charge above this threshold are flagged and read out. The Speedster detector has also been designed with other advanced in-pixel features to improve performance, including a low-noise, high-gain capacitive transimpedance amplifier that eliminates interpixel capacitance crosstalk (IPC), and in-pixel correlated double sampling subtraction to reduce reset noise. We measure the best energy resolution on the Speedster-EXD detector to be 206 eV (3.5%) at 5.89 keV and 172 eV (10.0%) at 1.49 keV. The average IPC to the four adjacent pixels is measured to be 0.25%±0.2% (i.e., consistent with zero). The pixel-to-pixel gain variation is measured to be 0.80%±0.03%, and a Monte Carlo simulation is applied to better characterize the contributions to the energy resolution.

Original languageEnglish (US)
Article number016001
JournalJournal of Astronomical Telescopes, Instruments, and Systems
Volume2
Issue number1
DOIs
StatePublished - Jan 1 2016

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Instrumentation
  • Astronomy and Astrophysics
  • Mechanical Engineering
  • Space and Planetary Science

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