Spin counting in electrically detected magnetic resonance via low-field defect state mixing

Corey J. Cochrane, Patrick M. Lenahan

Research output: Contribution to journalArticle

17 Scopus citations

Abstract

The work herein describes a method that allows one to measure paramagnetic defect densities in semiconductor and insulator based devices with electrically detected magnetic resonance (EDMR). The method is based upon the mixing of defect states which results from the dipolar coupling of paramagnetic sites at low magnetic fields. We demonstrate the measurement method with spin dependent tunneling in thin film dielectrics; however, the method should be equally applicable to paramagnetic defect density measurements in semiconductors via the more commonly utilized EDMR technique called spin dependent recombination.

Original languageEnglish (US)
Article number093503
JournalApplied Physics Letters
Volume104
Issue number9
DOIs
StatePublished - Mar 17 2014

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Spin counting in electrically detected magnetic resonance via low-field defect state mixing'. Together they form a unique fingerprint.

  • Cite this