Sr2AlTaO6 films for multilayer high-temperature superconducting device applications

A. T. Findikoglu, C. Doughty, S. Bhattacharya, Qi Li, X. X. Xi, T. Venkatesan, R. E. Fahey, A. J. Strauss, Julia M. Phillips

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Abstract

Thin films of Sr2AlTaO6 (SAT) and multilayers of YBa2Cu3O7 (YBCO)/SAT have been grown by pulsed laser deposition on [001] LaAlO3 substrates. X-ray diffraction shows that SAT grows on [001] LaAlO3 with the c-axis oriented normal to the substrate plane. X-ray rocking curve and Rutherford backscattering channeling measurements on SAT films yield full width at half maximum of <0.3°and minimum backscattering yield χmin of 5%-7%, respectively, indicating good crystallinity. The real part of the dielectric constant εr is found to be ∼23-30, with ∼6×107 V/m static breakdown electric field. Both the dielectric constant and the static breakdown field show negligible temperature dependence between 10 and 300 K. A 100 nm×10 μm×50 μm YBCO film on SAT shows zero-field critical current density of ∼1.3×106 A/cm2 at 77 K, with a superconducting transition temperature Tc0 of ∼89.2 K.

Original languageEnglish (US)
Pages (from-to)1718-1720
Number of pages3
JournalApplied Physics Letters
Volume61
Issue number14
DOIs
StatePublished - Dec 1 1992

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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    Findikoglu, A. T., Doughty, C., Bhattacharya, S., Li, Q., Xi, X. X., Venkatesan, T., Fahey, R. E., Strauss, A. J., & Phillips, J. M. (1992). Sr2AlTaO6 films for multilayer high-temperature superconducting device applications. Applied Physics Letters, 61(14), 1718-1720. https://doi.org/10.1063/1.108408