Stochastic Inference and Learning Enabled by Magnetic Tunnel Junctions

Abhronil Sengupta, Gopalakrishnan Srinivasan, Deboleena Roy, Kaushik Roy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Neuromorphic computational paradigms that exploit the stochastic switching behavior of devices in the presence of thermal noise is bringing about a wave of change in the way we perceive brain-inspired computing. In this article, we present proposals of spintronics enabled neuromorphic computing systems that perform probabilistic inference and online learning. Such stochastic neuromimetic hardware has the potential of enabling a new generation of state-compressed, low-power computing platforms, which can be significantly more efficient and scalable than their deterministic counterparts.

Original languageEnglish (US)
Title of host publication2018 IEEE International Electron Devices Meeting, IEDM 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages15.6.1-15.6.4
ISBN (Electronic)9781728119878
DOIs
StatePublished - Jan 16 2019
Event64th Annual IEEE International Electron Devices Meeting, IEDM 2018 - San Francisco, United States
Duration: Dec 1 2018Dec 5 2018

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
Volume2018-December
ISSN (Print)0163-1918

Conference

Conference64th Annual IEEE International Electron Devices Meeting, IEDM 2018
CountryUnited States
CitySan Francisco
Period12/1/1812/5/18

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Stochastic Inference and Learning Enabled by Magnetic Tunnel Junctions'. Together they form a unique fingerprint.

  • Cite this

    Sengupta, A., Srinivasan, G., Roy, D., & Roy, K. (2019). Stochastic Inference and Learning Enabled by Magnetic Tunnel Junctions. In 2018 IEEE International Electron Devices Meeting, IEDM 2018 (pp. 15.6.1-15.6.4). [8614616] (Technical Digest - International Electron Devices Meeting, IEDM; Vol. 2018-December). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IEDM.2018.8614616