Strain-induced crystal structure change in ultrathin films of Pr 0.7Sr0.3MnO3

Ian MacLaren, Zhong Lin Wang, H. S. Wang, Qi Li

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.

Original languageEnglish (US)
Pages (from-to)1406-1408
Number of pages3
JournalApplied Physics Letters
Volume80
Issue number8
DOIs
StatePublished - Feb 25 2002

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crystal structure
transmission electron microscopy
lattice parameters
expansion
high resolution
defects

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

MacLaren, Ian ; Wang, Zhong Lin ; Wang, H. S. ; Li, Qi. / Strain-induced crystal structure change in ultrathin films of Pr 0.7Sr0.3MnO3 In: Applied Physics Letters. 2002 ; Vol. 80, No. 8. pp. 1406-1408.
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Strain-induced crystal structure change in ultrathin films of Pr 0.7Sr0.3MnO3 . / MacLaren, Ian; Wang, Zhong Lin; Wang, H. S.; Li, Qi.

In: Applied Physics Letters, Vol. 80, No. 8, 25.02.2002, p. 1406-1408.

Research output: Contribution to journalArticle

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