Abstract
Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.
Original language | English (US) |
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Pages (from-to) | 1406-1408 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 80 |
Issue number | 8 |
DOIs | |
State | Published - Feb 25 2002 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)