Abstract
Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1406-1408 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 80 |
| Issue number | 8 |
| DOIs | |
| State | Published - Feb 25 2002 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
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MacLaren, I., Wang, Z. L., Wang, H. S., & Li, Q. (2002). Strain-induced crystal structure change in ultrathin films of Pr 0.7Sr0.3MnO3. Applied Physics Letters, 80(8), 1406-1408. https://doi.org/10.1063/1.1453482