Abstract
Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1406-1408 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 80 |
| Issue number | 8 |
| DOIs | |
| State | Published - Feb 25 2002 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
Cite this
}
Strain-induced crystal structure change in ultrathin films of Pr 0.7Sr0.3MnO3 . / MacLaren, Ian; Wang, Zhong Lin; Wang, H. S.; Li, Qi.
In: Applied Physics Letters, Vol. 80, No. 8, 25.02.2002, p. 1406-1408.Research output: Contribution to journal › Article
TY - JOUR
T1 - Strain-induced crystal structure change in ultrathin films of Pr 0.7Sr0.3MnO3
AU - MacLaren, Ian
AU - Wang, Zhong Lin
AU - Wang, H. S.
AU - Li, Qi
PY - 2002/2/25
Y1 - 2002/2/25
N2 - Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.
AB - Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.
UR - http://www.scopus.com/inward/record.url?scp=79956008412&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79956008412&partnerID=8YFLogxK
U2 - 10.1063/1.1453482
DO - 10.1063/1.1453482
M3 - Article
AN - SCOPUS:79956008412
VL - 80
SP - 1406
EP - 1408
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 8
ER -