Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

H. W. Jang, S. H. Baek, D. Ortiz, C. M. Folkman, R. R. Das, Y. H. Chu, P. Shafer, J. X. Zhang, S. Choudhury, V. Vaithyanathan, Y. B. Chen, D. A. Felker, M. D. Biegalski, M. S. Rzchowski, X. Q. Pan, D. G. Schlom, L. Q. Chen, R. Ramesh, C. B. Eom

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Abstract

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.

Original languageEnglish (US)
Article number107602
JournalPhysical review letters
Volume101
Issue number10
DOIs
StatePublished - Sep 4 2008

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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