Structural and band alignment properties of Al2O3 on epitaxial Ge grown on (100), (110), and (111)A GaAs substrates by molecular beam epitaxy

M. K. Hudait, Y. Zhu, D. Maurya, S. Priya, P. K. Patra, A. W.K. Ma, A. Aphale, I. Macwan

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Abstract

Structural and band alignment properties of atomic layer Al 2O3 oxide film deposited on crystallographically oriented epitaxial Ge grown in-situ on (100), (110), and (111)A GaAs substrates using two separate molecular beam epitaxy chambers were investigated using cross-sectional transmission microscopy (TEM) and x-ray photoelectron spectroscopy (XPS). High-resolution triple axis x-ray measurement demonstrated pseudomorphic and high-quality Ge epitaxial layer on crystallographically oriented GaAs substrates. The cross-sectional TEM exhibited a sharp interface between the Ge epilayer and each orientation of the GaAs substrate as well as the Al2O3 film and the Ge epilayer. The extracted valence band offset, ΔEv, values of Al2O3 relative to (100), (110), and (111) Ge orientations using XPS measurement were 3.17 eV, 3.34 eV, and 3.10 eV, respectively. Using XPS data, variations in ΔEv related to the crystallographic orientation were Δ E V (110) Ge > Δ E V (100) Ge ≥ Δ E V (111) Ge and the conduction band offset, ΔEc, related to the crystallographic orientation was Δ E c (111) Ge > Δ E c (110) Ge > Δ E c (100) Ge using the measured ΔEv, bandgap of Al 2O3 in each orientation, and well-known Ge bandgap of 0.67 eV. These band offset parameters are important for future application of Ge-based p- and n-channel metal-oxide field-effect transistor design.

Original languageEnglish (US)
Article number134311
JournalJournal of Applied Physics
Volume113
Issue number13
DOIs
StatePublished - Apr 7 2013

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molecular beam epitaxy
alignment
x ray spectroscopy
photoelectron spectroscopy
transmission electron microscopy
metal oxides
oxide films
conduction bands
field effect transistors
chambers
valence
high resolution
x rays

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Hudait, M. K. ; Zhu, Y. ; Maurya, D. ; Priya, S. ; Patra, P. K. ; Ma, A. W.K. ; Aphale, A. ; Macwan, I. / Structural and band alignment properties of Al2O3 on epitaxial Ge grown on (100), (110), and (111)A GaAs substrates by molecular beam epitaxy. In: Journal of Applied Physics. 2013 ; Vol. 113, No. 13.
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abstract = "Structural and band alignment properties of atomic layer Al 2O3 oxide film deposited on crystallographically oriented epitaxial Ge grown in-situ on (100), (110), and (111)A GaAs substrates using two separate molecular beam epitaxy chambers were investigated using cross-sectional transmission microscopy (TEM) and x-ray photoelectron spectroscopy (XPS). High-resolution triple axis x-ray measurement demonstrated pseudomorphic and high-quality Ge epitaxial layer on crystallographically oriented GaAs substrates. The cross-sectional TEM exhibited a sharp interface between the Ge epilayer and each orientation of the GaAs substrate as well as the Al2O3 film and the Ge epilayer. The extracted valence band offset, ΔEv, values of Al2O3 relative to (100), (110), and (111) Ge orientations using XPS measurement were 3.17 eV, 3.34 eV, and 3.10 eV, respectively. Using XPS data, variations in ΔEv related to the crystallographic orientation were Δ E V (110) Ge > Δ E V (100) Ge ≥ Δ E V (111) Ge and the conduction band offset, ΔEc, related to the crystallographic orientation was Δ E c (111) Ge > Δ E c (110) Ge > Δ E c (100) Ge using the measured ΔEv, bandgap of Al 2O3 in each orientation, and well-known Ge bandgap of 0.67 eV. These band offset parameters are important for future application of Ge-based p- and n-channel metal-oxide field-effect transistor design.",
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Structural and band alignment properties of Al2O3 on epitaxial Ge grown on (100), (110), and (111)A GaAs substrates by molecular beam epitaxy. / Hudait, M. K.; Zhu, Y.; Maurya, D.; Priya, S.; Patra, P. K.; Ma, A. W.K.; Aphale, A.; Macwan, I.

In: Journal of Applied Physics, Vol. 113, No. 13, 134311, 07.04.2013.

Research output: Contribution to journalArticle

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T1 - Structural and band alignment properties of Al2O3 on epitaxial Ge grown on (100), (110), and (111)A GaAs substrates by molecular beam epitaxy

AU - Hudait, M. K.

AU - Zhu, Y.

AU - Maurya, D.

AU - Priya, S.

AU - Patra, P. K.

AU - Ma, A. W.K.

AU - Aphale, A.

AU - Macwan, I.

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Y1 - 2013/4/7

N2 - Structural and band alignment properties of atomic layer Al 2O3 oxide film deposited on crystallographically oriented epitaxial Ge grown in-situ on (100), (110), and (111)A GaAs substrates using two separate molecular beam epitaxy chambers were investigated using cross-sectional transmission microscopy (TEM) and x-ray photoelectron spectroscopy (XPS). High-resolution triple axis x-ray measurement demonstrated pseudomorphic and high-quality Ge epitaxial layer on crystallographically oriented GaAs substrates. The cross-sectional TEM exhibited a sharp interface between the Ge epilayer and each orientation of the GaAs substrate as well as the Al2O3 film and the Ge epilayer. The extracted valence band offset, ΔEv, values of Al2O3 relative to (100), (110), and (111) Ge orientations using XPS measurement were 3.17 eV, 3.34 eV, and 3.10 eV, respectively. Using XPS data, variations in ΔEv related to the crystallographic orientation were Δ E V (110) Ge > Δ E V (100) Ge ≥ Δ E V (111) Ge and the conduction band offset, ΔEc, related to the crystallographic orientation was Δ E c (111) Ge > Δ E c (110) Ge > Δ E c (100) Ge using the measured ΔEv, bandgap of Al 2O3 in each orientation, and well-known Ge bandgap of 0.67 eV. These band offset parameters are important for future application of Ge-based p- and n-channel metal-oxide field-effect transistor design.

AB - Structural and band alignment properties of atomic layer Al 2O3 oxide film deposited on crystallographically oriented epitaxial Ge grown in-situ on (100), (110), and (111)A GaAs substrates using two separate molecular beam epitaxy chambers were investigated using cross-sectional transmission microscopy (TEM) and x-ray photoelectron spectroscopy (XPS). High-resolution triple axis x-ray measurement demonstrated pseudomorphic and high-quality Ge epitaxial layer on crystallographically oriented GaAs substrates. The cross-sectional TEM exhibited a sharp interface between the Ge epilayer and each orientation of the GaAs substrate as well as the Al2O3 film and the Ge epilayer. The extracted valence band offset, ΔEv, values of Al2O3 relative to (100), (110), and (111) Ge orientations using XPS measurement were 3.17 eV, 3.34 eV, and 3.10 eV, respectively. Using XPS data, variations in ΔEv related to the crystallographic orientation were Δ E V (110) Ge > Δ E V (100) Ge ≥ Δ E V (111) Ge and the conduction band offset, ΔEc, related to the crystallographic orientation was Δ E c (111) Ge > Δ E c (110) Ge > Δ E c (100) Ge using the measured ΔEv, bandgap of Al 2O3 in each orientation, and well-known Ge bandgap of 0.67 eV. These band offset parameters are important for future application of Ge-based p- and n-channel metal-oxide field-effect transistor design.

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