Structural and magnetic properties of biaxially textured NiFe 2O4 thin films grown on c-plane sapphire

Safoura Seifikar, Bridget Calandro, Elisabeth Deeb, Edward Sachet, Jijin Yang, Jon Paul Maria, Nazanin Bassiri-Gharb, Justin Schwartz

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Abstract

Chemical solution deposition is used to grow biaxially textured NiFe 2O4 (NFO) thin films on (0001) sapphire substrates; a high degree of out-of-plane orientation in the 〈111〉 direction is confirmed by θ-2θ X-ray diffraction and pole figures. X-ray φ-scanning indicates in-plane texture and an epitaxial relationship between NFO (111) and Al2O3 (0001) in two crystallographic variants. The out-of-plane magnetization exhibits improved Mr/M s from 0.5 in 110 nm-thick films to 0.8 in 60 nm-thick films. Compared to uniaxially textured NFO films on platinized silicon, the out-of-plane coercivity is reduced by 20%. The improved out-of-plane magnetic anisotropy is comparable to epitaxial NFO films of similar thickness deposited by pulsed laser deposition and sputtering.

Original languageEnglish (US)
Article number123910
JournalJournal of Applied Physics
Volume112
Issue number12
DOIs
StatePublished - Dec 1 2012

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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