Structural and magnetic properties of biaxially textured NiFe 2O4 thin films grown on c-plane sapphire

Safoura Seifikar, Bridget Calandro, Elisabeth Deeb, Edward Sachet, Jijin Yang, Jon Paul Maria, Nazanin Bassiri-Gharb, Justin Schwartz

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


Chemical solution deposition is used to grow biaxially textured NiFe 2O4 (NFO) thin films on (0001) sapphire substrates; a high degree of out-of-plane orientation in the 〈111〉 direction is confirmed by θ-2θ X-ray diffraction and pole figures. X-ray φ-scanning indicates in-plane texture and an epitaxial relationship between NFO (111) and Al2O3 (0001) in two crystallographic variants. The out-of-plane magnetization exhibits improved Mr/M s from 0.5 in 110 nm-thick films to 0.8 in 60 nm-thick films. Compared to uniaxially textured NFO films on platinized silicon, the out-of-plane coercivity is reduced by 20%. The improved out-of-plane magnetic anisotropy is comparable to epitaxial NFO films of similar thickness deposited by pulsed laser deposition and sputtering.

Original languageEnglish (US)
Article number123910
JournalJournal of Applied Physics
Issue number12
StatePublished - Dec 15 2012

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Structural and magnetic properties of biaxially textured NiFe <sub>2</sub>O<sub>4</sub> thin films grown on c-plane sapphire'. Together they form a unique fingerprint.

Cite this