Structural and thermoelectric properties of Bi2Sr 2Co2 Oy thin films on LaAlO3 (100) and fused silica substrates

Shufang Wang, A. Venimadhav, Shengming Guo, Ke Chen, Qi Li, A. Soukiassian, Darrell G. Schlom, Michael B. Katz, X. Q. Pan, Winnie Wong-Ng, Mark D. Vaudin, X. X. Xi

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Abstract

We have grown Bi2 Sr2 Co2 Oy thin films on LaAlO3 (100) and fused silica substrates by pulsed laser deposition. The films on LaAlO3 are c -axis oriented and partially in-plane aligned with multiple domains, while the films on fused silica are preferred c -axis oriented without in-plane alignment. The Seebeck coefficient and resistivity of films on both substrates are comparable to those of single crystals. An oxide p-n heterojunction was formed by depositing Bi2 Sr2 Co2 Oy film on Nb-doped SrTiO3 single crystal, which showed a rectifying behavior. These thin films and heterostructures may be used for future thermoelectric applications.

Original languageEnglish (US)
Article number022110
JournalApplied Physics Letters
Volume94
Issue number2
DOIs
StatePublished - Jan 23 2009

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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