Structural characterization of molecular-beam epitaxially grown Zn1-xMnxSe and Zn1-xMnxSe/ZnSe superlattices

S. B. Qadri, Nitin Samarth

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Epitaxially grown Zn1-xMnxSe and its superlattices with ZnSe have been characterized by x-ray diffraction techniques. Rocking curves of the (004) and (115) reflections were measured using parallel configuration. Values of unit cell parameters perpendicular to the substrate surface were obtained from the (004) and (006) reflections. The lattice parameter parallel to the substrate surface was obtained from the (444) and (115) reflections. The superlattices of (Zn, Mn)Se and ZnSe exhibit considerable tetragonal distortion and have significantly fewer dislocations than (Zn, Mn)Se films for the same Mn composition.

Original languageEnglish (US)
Pages (from-to)1884-1887
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Issue number3
StatePublished - Jan 1 1990

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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