Structural characterization of molecular-beam epitaxially grown Zn 1-x MnxSe on GaAs(001) substrates

S. B. Qadri, N. Samarth, J. K. Furdyna

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Abstract

Epitaxially grown single-crystal films of Zn1-xMnxSe have been characterized by x-ray diffraction techniques. Their dislocation densities have been estimated from double-crystal rocking-curve measurements. Values of the unit cell parameters normal and parallel to the substrate surface, as determined from (004) and (444) reflections, indicate that the films have some degree of tetragonal distortion for higher Mn compositions.

Original languageEnglish (US)
Pages (from-to)3622-3625
Number of pages4
JournalJournal of Applied Physics
Volume66
Issue number8
DOIs
Publication statusPublished - Dec 1 1989

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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