Octahedral tilt transitions in epitaxial AgTa0.5Nb 0.5O3 (ATN) films grown on (001)p (where p=pseudocubic) oriented SrRuO3/LaAlO3 and LaAlO 3 substrates were characterized by electron diffraction and high resolution x-ray diffraction. It was found that the ATN films exhibited octahedral rotations characteristic of the Pbcm space group, similar to those seen in bulk materials; however, the temperature of the M3↔ M2 phase transition has been suppressed by ∼250 K due to the fact that the correlation length for rotations about cp was significantly reduced. The average off-center B-cation displacements, which signify the degree of long-range order for these local cation positions, were negligibly small compared to bulk materials, as inferred from the near-zero intensity of the 1/4(00l)p-type reflections. On cooling, pronounced ordering of B-cation displacements occurred at ≈60 K which is significantly lower compared to bulk (≈310 K). The onset of this ordering coincides with a broad maximum in relative permittivity as a function of temperature. It is believed that point and planar defects in thin ATN films disrupt the complex sequence of in-phase and antiphase rotations around cp thereby reducing the effective strength of interactions between the tilting and cation displacements.
|Original language||English (US)|
|Journal||Journal of Applied Physics|
|State||Published - Jun 15 2010|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)