It was found that the low frequency voltage noise can be significantly enhanced by the impurities or detects in the doped sample, and the amplitude and shape of the noise are closely related to the initial conducting current of single crystal during its cooling. The experimental results indicated that the origin of the broad-band noise in the charge-density-wave system may result from the macroscopic defects or impurities in the sample.
|Original language||English (US)|
|Number of pages||5|
|Journal||Wuli Xuebao/Acta Physica Sinica|
|State||Published - Apr 1 1994|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)