TY - JOUR
T1 - Sub-grain orientation resolution during continuous loading using only far-field HEDM
AU - Nygren, K. E.
AU - Pagan, D. C.
AU - Miller, M. P.
N1 - Funding Information:
This work is supported financially by the Office of Naval Research Department of Defence contract N00014-16-1-2982, Dr. William Mullins, program manager. The Ti7Al material was provided by Adam Pilchak, Air Force Research Laboratory. This work is based upon research conducted at the Cornell High Energy Synchrotron Source (CHESS) which is supported by the National Science Foundation under award DMR-1332208.
PY - 2019/12/9
Y1 - 2019/12/9
N2 - A far-field data reduction algorithm for high-energy X-ray diffraction microscopy (HEDM) has been adapted to extract sub-grain orientation descriptors in a polycrystalline material during continuous in situ loading experiments. Previously, the standard data reduction algorithm would only extract grain-averaged strains, orientation, and the centroid position. A new descriptor, the grain orientation envelope (GOE), is introduced as a measure of the intragranular microstructure extracted from every grain during a continuous loading experiment. Initial results showing the evolution of a GOE from one grain in the titanium alloy, Ti-7Al, during a tension test is presented as a demonstration of the nature of the data.
AB - A far-field data reduction algorithm for high-energy X-ray diffraction microscopy (HEDM) has been adapted to extract sub-grain orientation descriptors in a polycrystalline material during continuous in situ loading experiments. Previously, the standard data reduction algorithm would only extract grain-averaged strains, orientation, and the centroid position. A new descriptor, the grain orientation envelope (GOE), is introduced as a measure of the intragranular microstructure extracted from every grain during a continuous loading experiment. Initial results showing the evolution of a GOE from one grain in the titanium alloy, Ti-7Al, during a tension test is presented as a demonstration of the nature of the data.
UR - http://www.scopus.com/inward/record.url?scp=85078163280&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85078163280&partnerID=8YFLogxK
U2 - 10.1088/1757-899X/580/1/012018
DO - 10.1088/1757-899X/580/1/012018
M3 - Conference article
AN - SCOPUS:85078163280
VL - 580
JO - IOP Conference Series: Materials Science and Engineering
JF - IOP Conference Series: Materials Science and Engineering
SN - 1757-8981
IS - 1
M1 - 012018
T2 - 40th Riso International Symposium on Materials Science: Metal Microstructures in 2D, 3D and 4D
Y2 - 2 September 2019 through 6 September 2019
ER -