A far-field data reduction algorithm for high-energy X-ray diffraction microscopy (HEDM) has been adapted to extract sub-grain orientation descriptors in a polycrystalline material during continuous in situ loading experiments. Previously, the standard data reduction algorithm would only extract grain-averaged strains, orientation, and the centroid position. A new descriptor, the grain orientation envelope (GOE), is introduced as a measure of the intragranular microstructure extracted from every grain during a continuous loading experiment. Initial results showing the evolution of a GOE from one grain in the titanium alloy, Ti-7Al, during a tension test is presented as a demonstration of the nature of the data.
|Original language||English (US)|
|Journal||IOP Conference Series: Materials Science and Engineering|
|State||Published - Dec 9 2019|
|Event||40th Riso International Symposium on Materials Science: Metal Microstructures in 2D, 3D and 4D - Copenhagen, Denmark|
Duration: Sep 2 2019 → Sep 6 2019
All Science Journal Classification (ASJC) codes
- Materials Science(all)