Superfluidity of thin He4 films

M. H.W. Chan, A. W. Yanof, J. D. Reppy

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Abstract

Superfluid persistent currents have been studied in He4 films adsorbed on a porous Vycor glass substrate at temperatures down to 150 mK. Stable superflow was observed in films as thin as 2.4 atomic layers at the lowest temperatures. Critical-velocity and superfluid-mass data were obtained as a function of film thickness. These data indicate that on a Vycor substrate superflow is only possible for films greater than 2 atomic layers in thickness and, further, that only the coverage above the first two layers contributes to the superflow.

Original languageEnglish (US)
Pages (from-to)1347-1350
Number of pages4
JournalPhysical Review Letters
Volume32
Issue number24
DOIs
StatePublished - Jan 1 1974

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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    Chan, M. H. W., Yanof, A. W., & Reppy, J. D. (1974). Superfluidity of thin He4 films. Physical Review Letters, 32(24), 1347-1350. https://doi.org/10.1103/PhysRevLett.32.1347