SURFACE AND IN-DEPTH ANALYSIS OF GLASS AND CERAMICS.

Carlo G. Pantano

Research output: Contribution to specialist publicationArticle

28 Scopus citations

Abstract

The most common techniques for surface analysis - Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), ion scattering spectroscopy (ISS), and sputter-induced photon spectroscopy (SIPS)-are discussed. Perturbing effects of the charged particle-beam probes on the surface under study are described; of particular concern are electromigration, heating, and electron-stimulated desorption. Subsequently, some studies of glass surface chemistry with XPS, ISS, SIMS, and SIPS are summarized.

Original languageEnglish (US)
Pages1154-1163, 1167
Volume60
No11
Specialist publicationAmerican Ceramic Society Bulletin
StatePublished - Jan 1 1981

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites

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