Surface and interface characterization of polymer films

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The surfaces and interfaces of polymer films impact many performance properties including adhesion, printability, barrier performance and physical appearance. This talk will provide an overview of x-ray photoelectron spectroscopy (XPS, also known as ESCA) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). These two tools are, arguably, the most powerful analytical techniques available for probing the chemical structure of polymer surfaces and interfaces. Case studies from converter films will be discussed to demonstrate these capabilities. Copyright

Original languageEnglish (US)
Title of host publicationWeb Coating and Handling Conference 2013
PublisherAssociation of International Metallizers, Coaters and Laminators
Pages1274-1303
Number of pages30
Volume2
StatePublished - 2013
EventWeb Coating and Handling Conference 2013 - Charleston, SC, United States
Duration: Oct 27 2013Oct 30 2013

Other

OtherWeb Coating and Handling Conference 2013
CountryUnited States
CityCharleston, SC
Period10/27/1310/30/13

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

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  • Cite this

    Shallenberger, J. (2013). Surface and interface characterization of polymer films. In Web Coating and Handling Conference 2013 (Vol. 2, pp. 1274-1303). Association of International Metallizers, Coaters and Laminators.