Surface characterization and manipulation of SWCNT for sensor applications

William J. Buttner; G. H. Chung; L. Evans; G. Hunter; Joseph R. Stetter; J. S. Jeong; J. Xu; Randy Lee Vander Wal; Rong Wang

doi:10.1149/1.2218986

Surface characterization and manipulation of SWCNT for sensor applications

William J. Buttner, G. H. Chung, L. Evans, G. Hunter, Joseph R. Stetter, J. S. Jeong, J. Xu, Randy Lee Vander Wal, Rong Wang

Research output: Contribution to journal › Conference article

1 Scopus citations

Abstract

Development of practical SWCNT-based chemical sensors is impeded because of difficulties in controlling both orientation/morphology in a MEMs-based sensor platform and the purity of nano-material. Methods to purify CNTs, prior to and following device fabrication are described. More critically, methodology to control the physical morphology of SWCNT on a MEMs platform has been applied for sensor applications. copyright The Electrochemical Society.

Original language	English (US)
Pages (from-to)	9-15
Number of pages	7
Journal	ECS Transactions
Volume	1
Issue number	21
DOIs	https://doi.org/10.1149/1.2218986
State	Published - Dec 1 2006
Event	Sensors, Actuators, and Microsystems - 208th Electrochemical Society Meeting - Los Angeles, CA, United States Duration: Oct 16 2005 → Oct 21 2005

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All Science Journal Classification (ASJC) codes

Engineering(all)

Cite this

Buttner, W. J., Chung, G. H., Evans, L., Hunter, G., Stetter, J. R., Jeong, J. S., Xu, J., Vander Wal, R. L., & Wang, R. (2006). Surface characterization and manipulation of SWCNT for sensor applications. ECS Transactions, 1(21), 9-15. https://doi.org/10.1149/1.2218986

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AU - Chung, G. H.

AU - Evans, L.

AU - Hunter, G.

AU - Stetter, Joseph R.

AU - Jeong, J. S.

AU - Xu, J.

AU - Vander Wal, Randy Lee

AU - Wang, Rong

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10.1149/1.2218986