Surface characterization and manipulation of SWCNT for sensor applications

William J. Buttner; G. H. Chung; L. Evans; G. Hunter; Joseph R. Stetter; J. S. Jeong; J. Xu; Randy Vander Wal; Rong Wang

doi:10.1149/1.2218986

Surface characterization and manipulation of SWCNT for sensor applications

William J. Buttner, G. H. Chung, L. Evans, G. Hunter, Joseph R. Stetter, J. S. Jeong, J. Xu, Randy Vander Wal, Rong Wang

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

Development of practical SWCNT-based chemical sensors is impeded because of difficulties in controlling both orientation/morphology in a MEMs-based sensor platform and the purity of nano-material. Methods to purify CNTs, prior to and following device fabrication are described. More critically, methodology to control the physical morphology of SWCNT on a MEMs platform has been applied for sensor applications. copyright The Electrochemical Society.

Original language	English (US)
Pages (from-to)	9-15
Number of pages	7
Journal	ECS Transactions
Volume	1
Issue number	21
DOIs	https://doi.org/10.1149/1.2218986
State	Published - 2006
Event	Sensors, Actuators, and Microsystems - 208th Electrochemical Society Meeting - Los Angeles, CA, United States Duration: Oct 16 2005 → Oct 21 2005

All Science Journal Classification (ASJC) codes

Engineering(all)

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10.1149/1.2218986

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title = "Surface characterization and manipulation of SWCNT for sensor applications",

abstract = "Development of practical SWCNT-based chemical sensors is impeded because of difficulties in controlling both orientation/morphology in a MEMs-based sensor platform and the purity of nano-material. Methods to purify CNTs, prior to and following device fabrication are described. More critically, methodology to control the physical morphology of SWCNT on a MEMs platform has been applied for sensor applications. copyright The Electrochemical Society.",

author = "Buttner, {William J.} and Chung, {G. H.} and L. Evans and G. Hunter and Stetter, {Joseph R.} and Jeong, {J. S.} and J. Xu and {Vander Wal}, Randy and Rong Wang",

year = "2006",

doi = "10.1149/1.2218986",

language = "English (US)",

volume = "1",

pages = "9--15",

journal = "ECS Transactions",

issn = "1938-5862",

publisher = "Electrochemical Society, Inc.",

number = "21",

note = "Sensors, Actuators, and Microsystems - 208th Electrochemical Society Meeting ; Conference date: 16-10-2005 Through 21-10-2005",

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TY - JOUR

T1 - Surface characterization and manipulation of SWCNT for sensor applications

AU - Buttner, William J.

AU - Chung, G. H.

AU - Evans, L.

AU - Hunter, G.

AU - Stetter, Joseph R.

AU - Jeong, J. S.

AU - Xu, J.

AU - Vander Wal, Randy

AU - Wang, Rong

PY - 2006

Y1 - 2006

N2 - Development of practical SWCNT-based chemical sensors is impeded because of difficulties in controlling both orientation/morphology in a MEMs-based sensor platform and the purity of nano-material. Methods to purify CNTs, prior to and following device fabrication are described. More critically, methodology to control the physical morphology of SWCNT on a MEMs platform has been applied for sensor applications. copyright The Electrochemical Society.

AB - Development of practical SWCNT-based chemical sensors is impeded because of difficulties in controlling both orientation/morphology in a MEMs-based sensor platform and the purity of nano-material. Methods to purify CNTs, prior to and following device fabrication are described. More critically, methodology to control the physical morphology of SWCNT on a MEMs platform has been applied for sensor applications. copyright The Electrochemical Society.

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U2 - 10.1149/1.2218986

DO - 10.1149/1.2218986

M3 - Conference article

AN - SCOPUS:33846796311

VL - 1

SP - 9

EP - 15

JO - ECS Transactions

JF - ECS Transactions

SN - 1938-5862

IS - 21

T2 - Sensors, Actuators, and Microsystems - 208th Electrochemical Society Meeting

Y2 - 16 October 2005 through 21 October 2005

ER -

Surface characterization and manipulation of SWCNT for sensor applications

Abstract

All Science Journal Classification (ASJC) codes

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