Surface characterization of nanomaterials and nanoparticles: Important needs and challenging opportunities

Donald R. Baer, Mark H. Engelhard, Grant E. Johnson, Julia Laskin, Jinfeng Lai, Karl Mueller, Prabhakaran Munusamy, Suntharampillai Thevuthasan, Hongfei Wang, Nancy Washton, Alison Elder, Brittany L. Baisch, Ajay Karakoti, Satyanarayana V.N.T. Kuchibhatla, Daewon Moon

Research output: Contribution to journalReview article

90 Citations (Scopus)

Abstract

This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published reports on the properties and behaviors of nanomaterials often have reported inadequate or incomplete characterization. As a consequence, the true value of the data in these reports is, at best, uncertain. With the increasing importance of nanomaterials in fundamental research and technological applications, it is desirable that researchers from the wide variety of disciplines involved recognize the nature of these often unexpected challenges associated with reproducible synthesis and characterization of nanomaterials, including the difficulties of maintaining desired materials properties during handling and processing due to their dynamic nature. It is equally valuable for researchers to understand how characterization approaches (surface and otherwise) can help to minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different environments. Appropriate application of traditional surface sensitive analysis methods (including x-ray photoelectron and Auger electron spectroscopies, scanning probe microscopy, and secondary ion mass spectroscopy) can provide information that helps address several of the analysis needs. In many circumstances, extensions of traditional data analysis can provide considerably more information than normally obtained from the data collected. Less common or evolving methods with surface selectivity (e.g., some variations of nuclear magnetic resonance, sum frequency generation, and low and medium energy ion scattering) can provide information about surfaces or interfaces in working environments (operando or in situ) or information not provided by more traditional methods. Although these methods may require instrumentation or expertise not generally available, they can be particularly useful in addressing specific questions, and examples of their use in nanomaterial research are presented.

Original languageEnglish (US)
Article number050820
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume31
Issue number5
DOIs
StatePublished - Sep 1 2013

Fingerprint

Nanostructured materials
Nanoparticles
nanoparticles
Ions
Scanning probe microscopy
ion scattering
Auger electron spectroscopy
synthesis
Photoelectrons
Auger spectroscopy
electron spectroscopy
Materials properties
photoelectrons
mass spectroscopy
selectivity
Nuclear magnetic resonance
Spectroscopy
Scattering
microscopy
X rays

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

Baer, Donald R. ; Engelhard, Mark H. ; Johnson, Grant E. ; Laskin, Julia ; Lai, Jinfeng ; Mueller, Karl ; Munusamy, Prabhakaran ; Thevuthasan, Suntharampillai ; Wang, Hongfei ; Washton, Nancy ; Elder, Alison ; Baisch, Brittany L. ; Karakoti, Ajay ; Kuchibhatla, Satyanarayana V.N.T. ; Moon, Daewon. / Surface characterization of nanomaterials and nanoparticles : Important needs and challenging opportunities. In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 2013 ; Vol. 31, No. 5.
@article{78071af074e342ed8448f75b0b53c84b,
title = "Surface characterization of nanomaterials and nanoparticles: Important needs and challenging opportunities",
abstract = "This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published reports on the properties and behaviors of nanomaterials often have reported inadequate or incomplete characterization. As a consequence, the true value of the data in these reports is, at best, uncertain. With the increasing importance of nanomaterials in fundamental research and technological applications, it is desirable that researchers from the wide variety of disciplines involved recognize the nature of these often unexpected challenges associated with reproducible synthesis and characterization of nanomaterials, including the difficulties of maintaining desired materials properties during handling and processing due to their dynamic nature. It is equally valuable for researchers to understand how characterization approaches (surface and otherwise) can help to minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different environments. Appropriate application of traditional surface sensitive analysis methods (including x-ray photoelectron and Auger electron spectroscopies, scanning probe microscopy, and secondary ion mass spectroscopy) can provide information that helps address several of the analysis needs. In many circumstances, extensions of traditional data analysis can provide considerably more information than normally obtained from the data collected. Less common or evolving methods with surface selectivity (e.g., some variations of nuclear magnetic resonance, sum frequency generation, and low and medium energy ion scattering) can provide information about surfaces or interfaces in working environments (operando or in situ) or information not provided by more traditional methods. Although these methods may require instrumentation or expertise not generally available, they can be particularly useful in addressing specific questions, and examples of their use in nanomaterial research are presented.",
author = "Baer, {Donald R.} and Engelhard, {Mark H.} and Johnson, {Grant E.} and Julia Laskin and Jinfeng Lai and Karl Mueller and Prabhakaran Munusamy and Suntharampillai Thevuthasan and Hongfei Wang and Nancy Washton and Alison Elder and Baisch, {Brittany L.} and Ajay Karakoti and Kuchibhatla, {Satyanarayana V.N.T.} and Daewon Moon",
year = "2013",
month = "9",
day = "1",
doi = "10.1116/1.4818423",
language = "English (US)",
volume = "31",
journal = "Journal of Vacuum Science and Technology A",
issn = "0734-2101",
publisher = "AVS Science and Technology Society",
number = "5",

}

Baer, DR, Engelhard, MH, Johnson, GE, Laskin, J, Lai, J, Mueller, K, Munusamy, P, Thevuthasan, S, Wang, H, Washton, N, Elder, A, Baisch, BL, Karakoti, A, Kuchibhatla, SVNT & Moon, D 2013, 'Surface characterization of nanomaterials and nanoparticles: Important needs and challenging opportunities', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, vol. 31, no. 5, 050820. https://doi.org/10.1116/1.4818423

Surface characterization of nanomaterials and nanoparticles : Important needs and challenging opportunities. / Baer, Donald R.; Engelhard, Mark H.; Johnson, Grant E.; Laskin, Julia; Lai, Jinfeng; Mueller, Karl; Munusamy, Prabhakaran; Thevuthasan, Suntharampillai; Wang, Hongfei; Washton, Nancy; Elder, Alison; Baisch, Brittany L.; Karakoti, Ajay; Kuchibhatla, Satyanarayana V.N.T.; Moon, Daewon.

In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 31, No. 5, 050820, 01.09.2013.

Research output: Contribution to journalReview article

TY - JOUR

T1 - Surface characterization of nanomaterials and nanoparticles

T2 - Important needs and challenging opportunities

AU - Baer, Donald R.

AU - Engelhard, Mark H.

AU - Johnson, Grant E.

AU - Laskin, Julia

AU - Lai, Jinfeng

AU - Mueller, Karl

AU - Munusamy, Prabhakaran

AU - Thevuthasan, Suntharampillai

AU - Wang, Hongfei

AU - Washton, Nancy

AU - Elder, Alison

AU - Baisch, Brittany L.

AU - Karakoti, Ajay

AU - Kuchibhatla, Satyanarayana V.N.T.

AU - Moon, Daewon

PY - 2013/9/1

Y1 - 2013/9/1

N2 - This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published reports on the properties and behaviors of nanomaterials often have reported inadequate or incomplete characterization. As a consequence, the true value of the data in these reports is, at best, uncertain. With the increasing importance of nanomaterials in fundamental research and technological applications, it is desirable that researchers from the wide variety of disciplines involved recognize the nature of these often unexpected challenges associated with reproducible synthesis and characterization of nanomaterials, including the difficulties of maintaining desired materials properties during handling and processing due to their dynamic nature. It is equally valuable for researchers to understand how characterization approaches (surface and otherwise) can help to minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different environments. Appropriate application of traditional surface sensitive analysis methods (including x-ray photoelectron and Auger electron spectroscopies, scanning probe microscopy, and secondary ion mass spectroscopy) can provide information that helps address several of the analysis needs. In many circumstances, extensions of traditional data analysis can provide considerably more information than normally obtained from the data collected. Less common or evolving methods with surface selectivity (e.g., some variations of nuclear magnetic resonance, sum frequency generation, and low and medium energy ion scattering) can provide information about surfaces or interfaces in working environments (operando or in situ) or information not provided by more traditional methods. Although these methods may require instrumentation or expertise not generally available, they can be particularly useful in addressing specific questions, and examples of their use in nanomaterial research are presented.

AB - This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published reports on the properties and behaviors of nanomaterials often have reported inadequate or incomplete characterization. As a consequence, the true value of the data in these reports is, at best, uncertain. With the increasing importance of nanomaterials in fundamental research and technological applications, it is desirable that researchers from the wide variety of disciplines involved recognize the nature of these often unexpected challenges associated with reproducible synthesis and characterization of nanomaterials, including the difficulties of maintaining desired materials properties during handling and processing due to their dynamic nature. It is equally valuable for researchers to understand how characterization approaches (surface and otherwise) can help to minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different environments. Appropriate application of traditional surface sensitive analysis methods (including x-ray photoelectron and Auger electron spectroscopies, scanning probe microscopy, and secondary ion mass spectroscopy) can provide information that helps address several of the analysis needs. In many circumstances, extensions of traditional data analysis can provide considerably more information than normally obtained from the data collected. Less common or evolving methods with surface selectivity (e.g., some variations of nuclear magnetic resonance, sum frequency generation, and low and medium energy ion scattering) can provide information about surfaces or interfaces in working environments (operando or in situ) or information not provided by more traditional methods. Although these methods may require instrumentation or expertise not generally available, they can be particularly useful in addressing specific questions, and examples of their use in nanomaterial research are presented.

UR - http://www.scopus.com/inward/record.url?scp=84885106657&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84885106657&partnerID=8YFLogxK

U2 - 10.1116/1.4818423

DO - 10.1116/1.4818423

M3 - Review article

C2 - 24482557

AN - SCOPUS:84885106657

VL - 31

JO - Journal of Vacuum Science and Technology A

JF - Journal of Vacuum Science and Technology A

SN - 0734-2101

IS - 5

M1 - 050820

ER -