TY - JOUR
T1 - Surface characterization of nanomaterials and nanoparticles
T2 - Important needs and challenging opportunities
AU - Baer, Donald R.
AU - Engelhard, Mark H.
AU - Johnson, Grant E.
AU - Laskin, Julia
AU - Lai, Jinfeng
AU - Mueller, Karl
AU - Munusamy, Prabhakaran
AU - Thevuthasan, Suntharampillai
AU - Wang, Hongfei
AU - Washton, Nancy
AU - Elder, Alison
AU - Baisch, Brittany L.
AU - Karakoti, Ajay
AU - Kuchibhatla, Satyanarayana V.N.T.
AU - Moon, Daewon
N1 - Funding Information:
This article has evolved from research programs, research conducted as part of the EMSL User Program (http://www.emsl.pnnl.gov/emslweb/), and interactions with colleagues from around the world. DRB in particular thanks Justin Teeguarden, Joel Pounds, and Brian Thrall and the other members of the NIEHS U19 consortium, as well as colleagues from ASTM Committee E42 on Surface Analysis and ISO Committees TC201 Surface Chemical Analysis and TC229 Nanotechnology. Portions of this work were performed using EMSL, a national scientific user facility sponsored by DOE-BER and located at PNNL. Aspects of the work have been supported by the DOE's offices of Basic Energy Science (BES) and BER and the NIEHS under Center grants U19 ES019544 and P30 ES01247, as well as a training grant (T32 ES07026). G.E.J. acknowledges support from the Linus Pauling Fellowship and PNNL's Laboratory Directed Research and Development Program.
PY - 2013/9
Y1 - 2013/9
N2 - This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published reports on the properties and behaviors of nanomaterials often have reported inadequate or incomplete characterization. As a consequence, the true value of the data in these reports is, at best, uncertain. With the increasing importance of nanomaterials in fundamental research and technological applications, it is desirable that researchers from the wide variety of disciplines involved recognize the nature of these often unexpected challenges associated with reproducible synthesis and characterization of nanomaterials, including the difficulties of maintaining desired materials properties during handling and processing due to their dynamic nature. It is equally valuable for researchers to understand how characterization approaches (surface and otherwise) can help to minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different environments. Appropriate application of traditional surface sensitive analysis methods (including x-ray photoelectron and Auger electron spectroscopies, scanning probe microscopy, and secondary ion mass spectroscopy) can provide information that helps address several of the analysis needs. In many circumstances, extensions of traditional data analysis can provide considerably more information than normally obtained from the data collected. Less common or evolving methods with surface selectivity (e.g., some variations of nuclear magnetic resonance, sum frequency generation, and low and medium energy ion scattering) can provide information about surfaces or interfaces in working environments (operando or in situ) or information not provided by more traditional methods. Although these methods may require instrumentation or expertise not generally available, they can be particularly useful in addressing specific questions, and examples of their use in nanomaterial research are presented.
AB - This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published reports on the properties and behaviors of nanomaterials often have reported inadequate or incomplete characterization. As a consequence, the true value of the data in these reports is, at best, uncertain. With the increasing importance of nanomaterials in fundamental research and technological applications, it is desirable that researchers from the wide variety of disciplines involved recognize the nature of these often unexpected challenges associated with reproducible synthesis and characterization of nanomaterials, including the difficulties of maintaining desired materials properties during handling and processing due to their dynamic nature. It is equally valuable for researchers to understand how characterization approaches (surface and otherwise) can help to minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different environments. Appropriate application of traditional surface sensitive analysis methods (including x-ray photoelectron and Auger electron spectroscopies, scanning probe microscopy, and secondary ion mass spectroscopy) can provide information that helps address several of the analysis needs. In many circumstances, extensions of traditional data analysis can provide considerably more information than normally obtained from the data collected. Less common or evolving methods with surface selectivity (e.g., some variations of nuclear magnetic resonance, sum frequency generation, and low and medium energy ion scattering) can provide information about surfaces or interfaces in working environments (operando or in situ) or information not provided by more traditional methods. Although these methods may require instrumentation or expertise not generally available, they can be particularly useful in addressing specific questions, and examples of their use in nanomaterial research are presented.
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U2 - 10.1116/1.4818423
DO - 10.1116/1.4818423
M3 - Review article
C2 - 24482557
AN - SCOPUS:84885106657
SN - 0734-2101
VL - 31
JO - Journal of Vacuum Science and Technology A
JF - Journal of Vacuum Science and Technology A
IS - 5
M1 - 050820
ER -