Surface characterization with ion‐induced desorption and multiphoton resonance ionization

Matthew H. Ervin, Nicholas Winograd

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

It is known that high‐molecular‐weight, thermally labile molecules can be desorbed intact using keV ion beams. This knowledge has led to numerous applications of fast atom bombardment and secondary ion mass spectrometry (SIMS) by mass spectrometric detection of the desorbed ions. Here we show that these measurements can be enhanced significantly by using resonance‐enhanced laser ionization to softly ionize the neutral component of the desorbed flux. This experimental configuration can produce sensitivity improvements of several orders of magnitude over SIMS while adding a certain degree of selectivity to the ionization process itself. Examples of this performance will be presented using a wide variety of molecules, including polycyclic aromatic hydrocarbons, organic polymers, molecular salts and biologically important molecules. Results from model systems to complex samples are discussed, along with their implications for submicron molecular imaging using this technique.

Original languageEnglish (US)
Pages (from-to)298-303
Number of pages6
JournalSurface and Interface Analysis
Volume21
Issue number5
DOIs
StatePublished - May 1994

Fingerprint

Ionization
Desorption
desorption
Secondary ion mass spectrometry
ionization
secondary ion mass spectrometry
Molecules
Molecular imaging
molecules
Organic polymers
Polycyclic Aromatic Hydrocarbons
polycyclic aromatic hydrocarbons
Polycyclic aromatic hydrocarbons
Ion beams
bombardment
Salts
selectivity
ion beams
Ions
Fluxes

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

@article{2c9451e3e37f4cd3a68e349737fa2a67,
title = "Surface characterization with ion‐induced desorption and multiphoton resonance ionization",
abstract = "It is known that high‐molecular‐weight, thermally labile molecules can be desorbed intact using keV ion beams. This knowledge has led to numerous applications of fast atom bombardment and secondary ion mass spectrometry (SIMS) by mass spectrometric detection of the desorbed ions. Here we show that these measurements can be enhanced significantly by using resonance‐enhanced laser ionization to softly ionize the neutral component of the desorbed flux. This experimental configuration can produce sensitivity improvements of several orders of magnitude over SIMS while adding a certain degree of selectivity to the ionization process itself. Examples of this performance will be presented using a wide variety of molecules, including polycyclic aromatic hydrocarbons, organic polymers, molecular salts and biologically important molecules. Results from model systems to complex samples are discussed, along with their implications for submicron molecular imaging using this technique.",
author = "Ervin, {Matthew H.} and Nicholas Winograd",
year = "1994",
month = "5",
doi = "10.1002/sia.740210506",
language = "English (US)",
volume = "21",
pages = "298--303",
journal = "Surface and Interface Analysis",
issn = "0142-2421",
publisher = "John Wiley and Sons Ltd",
number = "5",

}

Surface characterization with ion‐induced desorption and multiphoton resonance ionization. / Ervin, Matthew H.; Winograd, Nicholas.

In: Surface and Interface Analysis, Vol. 21, No. 5, 05.1994, p. 298-303.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Surface characterization with ion‐induced desorption and multiphoton resonance ionization

AU - Ervin, Matthew H.

AU - Winograd, Nicholas

PY - 1994/5

Y1 - 1994/5

N2 - It is known that high‐molecular‐weight, thermally labile molecules can be desorbed intact using keV ion beams. This knowledge has led to numerous applications of fast atom bombardment and secondary ion mass spectrometry (SIMS) by mass spectrometric detection of the desorbed ions. Here we show that these measurements can be enhanced significantly by using resonance‐enhanced laser ionization to softly ionize the neutral component of the desorbed flux. This experimental configuration can produce sensitivity improvements of several orders of magnitude over SIMS while adding a certain degree of selectivity to the ionization process itself. Examples of this performance will be presented using a wide variety of molecules, including polycyclic aromatic hydrocarbons, organic polymers, molecular salts and biologically important molecules. Results from model systems to complex samples are discussed, along with their implications for submicron molecular imaging using this technique.

AB - It is known that high‐molecular‐weight, thermally labile molecules can be desorbed intact using keV ion beams. This knowledge has led to numerous applications of fast atom bombardment and secondary ion mass spectrometry (SIMS) by mass spectrometric detection of the desorbed ions. Here we show that these measurements can be enhanced significantly by using resonance‐enhanced laser ionization to softly ionize the neutral component of the desorbed flux. This experimental configuration can produce sensitivity improvements of several orders of magnitude over SIMS while adding a certain degree of selectivity to the ionization process itself. Examples of this performance will be presented using a wide variety of molecules, including polycyclic aromatic hydrocarbons, organic polymers, molecular salts and biologically important molecules. Results from model systems to complex samples are discussed, along with their implications for submicron molecular imaging using this technique.

UR - http://www.scopus.com/inward/record.url?scp=0028427264&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028427264&partnerID=8YFLogxK

U2 - 10.1002/sia.740210506

DO - 10.1002/sia.740210506

M3 - Article

AN - SCOPUS:0028427264

VL - 21

SP - 298

EP - 303

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 5

ER -