Surface-enhanced raman detection on metalized nanostructured poly(p-xylylene) films

Ping Kao, Niranjan A. Malvadkar, Murat Cetinkaya, Hui Wang, David L. Allara, Melik C. Demirel

Research output: Contribution to journalArticle

56 Citations (Scopus)

Abstract

A study has reported the development of surface-enhanced Raman spectroscopy (SERS) substrates that provide a highly uniform and reproducible bioanalysis surface and demonstrate examples of 'fingerprint' signals from different types of bacteria, in which the signals differ based on variations in the cell membranes. The method is using in controlling surface morphology and topology prior to SERS-active metal deposition. The SERS substrate is reusable and inexpensive, and also easy for fabrication. The results of the demonstration show clear differentiation between Gram-positive and Gram-negative species. The potential for SERS to produce spectra that can be used for rapid whole-organism fingerprinting is extremely important for outbreak prediction, reducing the mortality rate from misdiagnosis of infectious diseases in hospitals, and understanding the fundamental strain epistemology in infectious diseases.

Original languageEnglish (US)
Pages (from-to)3562-3565
Number of pages4
JournalAdvanced Materials
Volume20
Issue number18
DOIs
StatePublished - Sep 17 2008

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Raman spectroscopy
Substrates
Cell membranes
Surface morphology
Bacteria
Demonstrations
Metals
Topology
poly(p-xylylene)
Fabrication

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Kao, Ping ; Malvadkar, Niranjan A. ; Cetinkaya, Murat ; Wang, Hui ; Allara, David L. ; Demirel, Melik C. / Surface-enhanced raman detection on metalized nanostructured poly(p-xylylene) films. In: Advanced Materials. 2008 ; Vol. 20, No. 18. pp. 3562-3565.
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Surface-enhanced raman detection on metalized nanostructured poly(p-xylylene) films. / Kao, Ping; Malvadkar, Niranjan A.; Cetinkaya, Murat; Wang, Hui; Allara, David L.; Demirel, Melik C.

In: Advanced Materials, Vol. 20, No. 18, 17.09.2008, p. 3562-3565.

Research output: Contribution to journalArticle

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