Surface morphology and thickness dependence of the properties of MgB 2 thin films by hybrid physical-chemical vapor deposition

Chenggang Zhuang, Ke Chen, Joan M. Redwing, Qi Li, X. X. Xi

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21 Scopus citations

Abstract

The influence of growth parameters in hybrid physical-chemical vapor deposition (HPCVD) on surface morphologies of MgB2 thin films, and the dependence of their properties on film thickness are systematically studied. As the HPCVD MgB2 films grow in the Volmer-Weber mode, where islands coalesce into continuous films, the grain size has an important influence on the film morphology. We found that films deposited with higher growth rates have larger grains, and a larger grain size appears to correspond to a larger film roughness. Under optimized deposition conditions, the surface root mean square (RMS) roughness is 1.2nm over a 1νm × 1νm area for a 100nm thick film. The surface morphology does not directly affect the structural and superconducting properties of the MgB2 films. The results of ultrathin MgB2 films, as thin as 10nm, with excellent superconducting properties are also presented in this paper.

Original languageEnglish (US)
Article number055004
JournalSuperconductor Science and Technology
Volume23
Issue number5
DOIs
StatePublished - May 4 2010

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

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