Surface potential imaging of solution processable acene-based thin film transistors

Lucile C. Teague, Behrang H. Hamadani, Oana D. Jurchescu, Sankar Subramanian, John E. Anthony, Thomas N. Jackson, Curt A. Richter, David J. Gundlach, James G. Kushmerick

Research output: Contribution to journalArticlepeer-review

38 Scopus citations

Abstract

A scanning Kelvin probe microscopy (SKPM) study was conducted for solution-processable organic-thin film transistor (OTFTs) to investigate the role of film microstructure on the performance of device. Thin-film transistors used for the study was made from spun-cast fluorinated 5,11- bis(triethylsilylethynyl) anthradithiophene (diF-TESADT) on pentafluorobenzene thiol (PFBT) functionalized electrodes. It was observed during the study that the mobility of OTFTs strongly depend on the distinct channel length and decreased with an increase in channel length. It was also found that there is a correlation between organic thin-film microstructure and potential drops within the working devices. The study also found that the nature and location of the potential drop change with the device channel length. The study can be used for developing low-cost and solution-processable organic electronic devices.

Original languageEnglish (US)
Pages (from-to)4513-4516
Number of pages4
JournalAdvanced Materials
Volume20
Issue number23
DOIs
StatePublished - Dec 2 2008

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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