Surface wave scattering from elliptical cracks for failure prediction

B. R. Tittmann, O. Buck, L. Ahlberg, M. De Billy, F. Cohen-Tenoudji, A. Jungman, G. Quentin

Research output: Contribution to journalArticlepeer-review

28 Scopus citations

Abstract

The scattered radiation patterns from surface cracks irradiated by acoustic surface waves are interpreted to provide estimates of crack length and aspect ratio, geometric crack parameters needed to enable failure prediction. The technique is demonstrated for circular and elliptical cracks as small as 100 μm in depth with an accuracy of about 10%. The key features are the positions and spacing of peaks and nulls in angular frequency dependence of scattered surface wave intensity. A simple model based on optical diffraction theory is demonstrated on cracks in commercial hot-pressed silicon nitride studied at 100 MHz and on spark-eroded slots in commercial aluminum studied at 2-10 MHz. The results are used to calculate the stress intensity factors and to describe the direction of crack propagation for a variety of real and simulated cracks. Implications of the technique with respect to crack closure and effects of stress and time are also discussed.

Original languageEnglish (US)
Pages (from-to)142-150
Number of pages9
JournalJournal of Applied Physics
Volume51
Issue number1
DOIs
StatePublished - 1980

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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