SWIFT XRT Point Spread Function measured at the Panter end-to-end tests

A. Moretti, S. Campana, G. Tagliaferri, A. F. Abbey, R. M. Ambrosi, L. Angelini, A. Beardmore, H. W. Bräuninger, W. Burkert, D. N. Burrows, M. Capalbi, G. Chincarini, O. Citterio, G. Cusumano, M. J. Freyberg, P. Giommi, G. D. Hartner, J. E. Hill, K. Mori, D. MorrisK. Mukerjee, J. A. Nousek, J. Osborne, A. D.T. Short, F. Tamburelli, D. J. Watson, A. Wells

Research output: Contribution to journalConference articlepeer-review

53 Scopus citations

Abstract

The SWIFT X-ray Telescope (XRT) is designed to make astrometric, spectroscopic and photometric observations of the X-ray emission from Gamma-ray bursts and their afterglows, in the energy band 0.2-10 keV. Here we report the results of the analysis of SWIFT XRT Point Spread Function (PSF) as measured during the end-to-end calibration campaign at the Panter X-Ray beam line facility. The analysis comprises the study of the PSF both on-axis and off-axis. We compare the laboratory results with the expectations from the ray-tracing software and from the mirror module tested as a single unit. We show that the measured HEW meets the mission scientific requirements. On the basis of the calibration data we build an analytical model which is able to reproduce the PSF as a function of the energy and the position within the detector.

Original languageEnglish (US)
Pages (from-to)232-240
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5165
DOIs
StatePublished - May 3 2004
EventX-Ray and Gamma-Ray Instrumentation for Astronomy XIII - San Diego, CA, United States
Duration: Aug 3 2003Aug 5 2003

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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