System life data analysis with dependent partial knowledge on the exact cause of system failure

Dennis K.J. Lin, Frank M. Guess

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

Because of cost and time factors the exact cause of system failure may be known only partially. For example, the cause is narrowed down to a component in a subsystem or a smaller set of components. This is called "masking" of the exact failure mode. Our paper focuses on reliability estimation when the masking probability is dependent on the particular cause of failure.

Original languageEnglish (US)
Pages (from-to)535-544
Number of pages10
JournalMicroelectronics Reliability
Volume34
Issue number3
DOIs
StatePublished - Mar 1994

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'System life data analysis with dependent partial knowledge on the exact cause of system failure'. Together they form a unique fingerprint.

Cite this