Target and projectile cross sections for F ions on Ti, V, Cr, Fe, and Co: 1.7 MeV/amu

Ann Schmiedekamp, Tom J. Gray, B. L. Doyle, U. Schiebel

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

Measurements of the target-thickness dependences of the target K x-ray production yields are reported for 1.7-MeV/amu Fq+ (q=6,8 and 9) ions incident upon thin solid targets of elements from Ti to Co. Target K x-ray production cross sections were extracted in the limit of vanishing target thickness. Comparisons of the data to theoretical estimates based upon combinations of direct ionization and electron-transfer processes are presented. Projectile K-vacancy production and quenching cross sections were obtained from the three-component model for the target K x-ray data as a function of foil thickness. Comparisons of the projectile parameters to theoretical estimates based upon electron transfer, direct ionization, and excitation processes are presented.

Original languageEnglish (US)
Pages (from-to)2167-2172
Number of pages6
JournalPhysical Review A
Volume19
Issue number6
DOIs
StatePublished - Jan 1 1979

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projectiles
target thickness
cross sections
electron transfer
ions
ionization
x rays
estimates
foils
quenching
excitation

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Schmiedekamp, Ann ; Gray, Tom J. ; Doyle, B. L. ; Schiebel, U. / Target and projectile cross sections for F ions on Ti, V, Cr, Fe, and Co : 1.7 MeV/amu. In: Physical Review A. 1979 ; Vol. 19, No. 6. pp. 2167-2172.
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Target and projectile cross sections for F ions on Ti, V, Cr, Fe, and Co : 1.7 MeV/amu. / Schmiedekamp, Ann; Gray, Tom J.; Doyle, B. L.; Schiebel, U.

In: Physical Review A, Vol. 19, No. 6, 01.01.1979, p. 2167-2172.

Research output: Contribution to journalArticle

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