TEM characterization of crept and irradiated nano-structured ferritic alloys

J. Bentley, D. T. Hoelzer, J. T. Busby, A. G. Certain, T. R. Allen, D. Kaoumi, A. T. Motta, M. A. Kirk

Research output: Contribution to journalArticle

4 Scopus citations
Original languageEnglish (US)
Pages (from-to)1350-1351
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 1 2009

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Bentley, J., Hoelzer, D. T., Busby, J. T., Certain, A. G., Allen, T. R., Kaoumi, D., Motta, A. T., & Kirk, M. A. (2009). TEM characterization of crept and irradiated nano-structured ferritic alloys. Microscopy and Microanalysis, 15(SUPPL. 2), 1350-1351. https://doi.org/10.1017/S1431927609095828